PICOSECOND TRANSIENT THERMAL IMAGING USING A CCD BASED THERMOREFLECTANCE SYSTEM

被引：0
|
作者：
Christofferson, James [1 ]
Yazawa, Kazuaki [1 ]
Shakouri, Ali [1 ]
机构：
[1] Univ Calif Santa Cruz, Baskin Sch Engn, Santa Cruz, CA 95064 USA
来源：
PROCEEDINGS OF THE ASME INTERNATIONAL HEAT TRANSFER CONFERENCE - 2010, VOL 4: HEAT TRANSFER MEASUREMENT TECHNIQUES, HEAT TRANSFER EQUIPMENT, THERMOELECTRICS | 2010年
关键词：
TEMPERATURE;
D O I：
暂无
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
A new Charge Coupled Device (CCD) based, full-field thermoreflectance thermal imaging technique is demonstrated with 800 picoseconds temporal resolution. Transient thermal images of pulsed heating in single interconnect vias of 350nm and 550nm in diameter are shown. The use of pulsed laser diodes and dedicated synchronization circuits can significantly lower the cost and the image acquisition time compared to the scanning pump-probe laser systems. Also the same set up can be used to study transient thermal phenomena in a wide dynamic range from sub nanoseconds to seconds.
引用
收藏
页码：93 / 97
页数：5
相关论文
共 50 条
  • [21] A CCD thermoreflectance thermography system and its calibration
    Komarov, P. L.
    Burzo, M. G.
    Raad, P. E.
    THERMES 2007: THERMAL CHALLENGES IN NEXT GENERATION ELECTRONIC SYSTEMS, 2007, : 91 - +
  • [22] Measurement of Thermal Conductivity of Nanofluids and Thermal Interface Materials Using the Laser-Based Transient Thermoreflectance Method
    Burzo, Mihai G.
    Raad, Peter E.
    Komarov, Pavel L.
    Wicaksono, Cakra
    Choi, Tae Y.
    2013 TWENTY NINTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM (SEMI-THERM), 2013, : 194 - 199
  • [23] Experimental Investigation of Thermal Actuation Crosstalk in Phase-Change RF Switches Using Transient Thermoreflectance Imaging
    Singh, Tejinder
    Mansour, Raafat R.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (07) : 3537 - 3544
  • [24] Study on the Cross Plane Thermal Transport of Polycrystalline Molybdenum Nanofilms by Applying Picosecond Laser Transient Thermoreflectance Method
    Miao, Tingting
    Ma, Weigang
    Zhang, Xing
    Kubo, Keisuke
    Kohno, Masamichi
    Takata, Yasuyuki
    Ikuta, Tatsuya
    Takahashi, Koji
    JOURNAL OF NANOMATERIALS, 2014, 2014
  • [25] Transient thermoreflectance imaging of active photonic crystals
    Moreau, Virginie
    Tessier, Gilles
    Raineri, Fabrice
    Brunstein, Maia
    Yacomotti, Alejandro
    Raj, Rama
    Sagnes, Isabelle
    Levenson, Ariel
    De Wilde, Yannick
    APPLIED PHYSICS LETTERS, 2010, 96 (09)
  • [26] Temperature-Dependent Thermal Impedance Measurement of GaN-Based HEMTs Using Transient Thermoreflectance
    Zheng, Xiang
    Pomeroy, James W.
    Jindal, Gautam
    Kuball, Martin
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (04) : 2367 - 2372
  • [27] Mapping Temperature in OLED Displays Using CCD Thermoreflectance
    Katz, Noam
    Arango, Alexi
    Hudgings, Janice
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2014, 26 (02) : 194 - 197
  • [28] Accurate Thermoreflectance Imaging of Nano-Features Using Thermal Decay
    Kendig, Dustin
    Hohensee, Gregory
    Pek, Ella
    Kuang, Wan
    Yazawa, Kazuaki
    Shakouri, Ali
    PROCEEDINGS OF THE SIXTEENTH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS ITHERM 2017, 2017, : 23 - 29
  • [29] CCD-based thermoreflectance microscopy: principles and applications
    Farzaneh, M.
    Maize, K.
    Luerssen, D.
    Summers, J. A.
    Mayer, P. M.
    Raad, P. E.
    Pipe, K. P.
    Shakouri, A.
    Ram, R. J.
    Hudgings, Janice A.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2009, 42 (14)
  • [30] Thermoreflectance based thermal microscope
    Christofferson, J
    Shakouri, A
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (02): : 024903 - 1
12345