Modeling Process Variability in Scaled CMOS Technology

被引：0
|
作者：
Saha, Samar K. [1 ]
机构：
[1] Univ Colorado, Colorado Springs, CO 80907 USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2010年 / 27卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
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页码：8 / 8
页数：1
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