Welcome to IEEE AUTOTESTCON 2017

被引：0

作者：

Pace, Teresa

机构：

[1] IEEE Instrumentation and Measurement Society, United States

[2] IEEE Aerospace and Electronic Systems Society, United States

来源：

IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 2017年 / 20卷 / 04期

关键词：

D O I：

10.1109/MIM.2017.8006386

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2 / 2

页数：1

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