Aberration-Corrected Imaging in Transmission Electron Microscopy An Introduction

被引：0
|
作者：
Rabenberg, Lew [1 ]
机构：
[1] Univ Texas Austin, Austin, TX 78712 USA
来源：
PHYSICS TODAY | 2011年 / 64卷 / 07期
关键词：
D O I：
10.1063/PT.3.1171
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：55 / 56
页数：3
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