Analysis Method of Multilayer Ceramic Capacitor Fracture by the Phase-Field

The traditional method assesses the impact of fractures on electronics by calculating test results for many samples, which ignores variation in manufacturing parameters between individuals and does not accurately reflect the actual state. This article proposes a fracture analysis method for multilayer ceramic capacitors (MLCC) by the phase field because of complex structures and diverse manufacturing parameters. This method is based on Griffith's theory, and the phase field to calculate crack expansion and fracture effects on the electric potential of MLCC is obtained. Finally, MLCC of packages 0603, 1210, and 2220 are studied as numerical examples of applications for investigation. Calculated results are consistent with tests, which verifies the accuracy of this method. In addition, the mechanism of the MLCC fracture on its electrical characteristics is given, and the impact of solder height and the internal electrode number on the fracture are analyzed using this method.