Logic-in-Memory Operation of Ternary NAND/NOR Universal Logic Gates using Double-Gated Feedback Field-Effect Transistors

被引:12
|
作者
Son, Jaemin [1 ]
Shin, Yunwoo [1 ]
Cho, Kyoungah [1 ]
Kim, Sangsig [1 ]
机构
[1] Korea Univ, Dept Elect Engn, 145 Anam Ro, Seoul 02841, South Korea
基金
新加坡国家研究基金会;
关键词
field-effect transistor; logic-in-memory; multivalued logic; positive feedback loop; universal gate; HIGH-PERFORMANCE; IMPLEMENTATION; INVERTER; DESIGN;
D O I
10.1002/aelm.202201134
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study, the logic-in-memory operations are demonstrated of ternary NAND and NOR logic gates consisting of double-gated feedback field-effect transistors. The component transistors reconfigure their operation modes into n- or p-channel modes by adjusting the gate biases. The highly symmetrical operation between these operation modes with an excellent on-current ratio of 1.03 enables three distinguishable and stable logic levels in the ternary logic gates. Moreover, the ternary logic gates maintain the three logic states for several tens to hundreds of seconds under zero-bias condition. This study demonstrates that the ternary logic gates are promising candidates for next-generation low-power computing systems.
引用
收藏
页数:9
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