Topology-Guided Graph Learning for Process Fault Diagnosis

被引:26
|
作者
Jia, Mingwei [1 ]
Hu, Junhao [1 ]
Liu, Yi [1 ]
Gao, Zengliang [1 ]
Yao, Yuan [2 ]
机构
[1] Zhejiang Univ Technol, Inst Proc Equipment & Control Engn, Hangzhou 310023, Peoples R China
[2] Natl Tsing Hua Univ, Dept Chem Engn, Hsinchu 300044, Taiwan
基金
中国国家自然科学基金;
关键词
INFORMED NEURAL-NETWORKS; MODEL;
D O I
10.1021/acs.iecr.2c03628
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Faults in the process industry can be diagnosed using various data-driven methods, but the intrinsic relationships between inputs and outputs, particularly the physical consistency of model prediction logic, have received little attention. To address this issue, we propose a topology-guided graph learning fault diagnosis framework that combines the concept of graphs with process physics. Our framework focuses on knowledge embedding and explanation and includes several key components: a topology graph based on the flowchart, a self-attention mechanism to discover distinctive knowledge from data, graph convolution to capture variable relationships, graph pooling to coarsen graph data, and a gating mechanism to establish long-term dependencies. We also use a graph explainer to assess the physical consistency of the model's prediction logic. We demonstrate the feasibility of our method using the Tennessee Eastman process and show that it is not a black-box model but rather has natural advantages in terms of effectiveness and explanation.
引用
收藏
页码:3238 / 3248
页数:11
相关论文
共 50 条
  • [31] Topology-guided path integral approach for stochastic optimal control in cluttered environment
    Ha, Jung-Su
    Park, Soon-Seo
    Choi, Han-Lim
    ROBOTICS AND AUTONOMOUS SYSTEMS, 2019, 113 : 81 - 93
  • [32] Topology-guided functional multiplicity of iron(III)-based metal-organic frameworks
    Virmani, Erika
    Beyer, Ole
    Luening, Ulrich
    Ruschewitz, Uwe
    Wuttke, Stefan
    MATERIALS CHEMISTRY FRONTIERS, 2017, 1 (10) : 1965 - 1974
  • [33] Construction and Evolution of Fault Diagnosis Knowledge Graph in Industrial Process
    Han, Huihui
    Wang, Jian
    Wang, Xiaowen
    Chen, Sen
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 71
  • [34] Xylylene Clips for the Topology-Guided Control of the Inclusion and Self-Assembling Properties of Cyclodextrins
    Neva, Tania
    Carmona, Thais
    Benito, Juan M.
    Przybylski, Cedric
    Ortiz Mellet, Carmen
    Mendicuti, Francisco
    Garcia Fernandez, Jose M.
    JOURNAL OF ORGANIC CHEMISTRY, 2018, 83 (10): : 5588 - 5597
  • [35] Fault Diagnosis of Energy Networks: A Graph Embedding Learning Approach
    Zhang, Jingfei
    Cheng, Yean
    He, Xiao
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 71
  • [36] Locate before Segment: Topology-guided Retinal Layer Segmentation in Optical Coherence Tomography Images
    Lu, Ye
    Shen, Yutian
    Xing, Xiaohan
    Meng, Max Q-H
    2023 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, ICRA, 2023, : 4775 - 4781
  • [37] Topology-Guided Stepwise Insertion of Three Secondary Linkers in Zirconium Metal-Organic Frameworks
    Zhang, Xin
    Frey, Brandon L.
    Chen, Yu-Sheng
    Zhang, Jian
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2018, 140 (24) : 7710 - 7715
  • [38] Stereospecific Cyclic Poly(methyl methacrylate) and Its Topology-Guided Hierarchically Controlled Supramolecular Assemblies
    Ren, Jing Ming
    Satoh, Kotaro
    Goh, Tor Kit
    Blencowe, Anton
    Nagai, Kanji
    Ishitake, Kenji
    Christofferson, Andrew Joseph
    Yiapanis, George
    Yarovsky, Irene
    Kamigaito, Masami
    Qiao, Greg Guanghua
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2014, 53 (02) : 459 - 464
  • [39] Fault diagnosis of TE process based on incremental learning
    Wu, Dongsheng
    Gu, Yudi
    Luo, Deng
    Yang, Qing
    PROCEEDINGS OF THE 39TH CHINESE CONTROL CONFERENCE, 2020, : 4227 - 4232
  • [40] Semisupervised Machine Fault Diagnosis Fusing Unsupervised Graph Contrastive Learning
    Yang, Chaoying
    Liu, Jie
    Zhou, Kaibo
    Jiang, Xingxing
    IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2023, 19 (08) : 8644 - 8653