Study of the Reflectivity and Microstructure of Mo/Be Multilayer Mirrors

被引:0
|
作者
Antysheva, G. D. [1 ,2 ]
Kumar, N. [1 ]
Pleshkov, R. S. [1 ]
Yunin, P. A. [1 ,2 ]
Polkovnikov, V. N. [1 ]
Chkhalo, N. I. [1 ]
机构
[1] Russian Acad Sci, Inst Phys Microstruct, Afonino, Nizhnii Novgorod 603087, Russia
[2] Lobachevsky State Univ Nizhny Novgorod, Nizhnii Novgorod 603950, Russia
来源
JOURNAL OF SURFACE INVESTIGATION | 2023年 / 17卷 / 06期
关键词
microstructure; Mo/Be multilayer film; reflection coefficient; interface; NANOSCALE; EUV;
D O I
10.1134/S1027451023060241
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The reflection coefficient and microstructure of Mo/Be multilayer mirrors are studied as functions of Gamma, i.e., the ratio of the Mo-layer thickness to the period dp. The thickness and period of the layers are studied using X-ray diffraction (wavelength 0.154 nm). Clearly defined high-intensity Bragg-reflection peaks indicate good reproducibility of the layer thicknesses over the depth of the multilayer structure and the high quality of interfaces. The reflectivity of the mirror at a wavelength of 11.4 nm is maximum 62% at Gamma = 0.42. It sharply decreases at higher and lower values of Gamma. Both Mo and Be layers at Gamma = 0.42 are polycrystals, which are studied using X-ray diffraction and Raman spectroscopy, respectively. It is also found that the sizes of crystallites almost coincide with the thicknesses of Be and Mo layers in the period.
引用
收藏
页码:1319 / 1322
页数:4
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