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- [31] A critical review of fabrication challenges and reliability issues in top/bottom gated MoS2 field-effect transistorsNANOTECHNOLOGY, 2023, 34 (23)Thoutam, Laxman Raju论文数: 0 引用数: 0 h-index: 0机构: Amrita Vishwa Vidyapeetham, Amrita Sch Nanosci & Mol Med, Kochi 682041, India Amrita Vishwa Vidyapeetham, Amrita Sch Nanosci & Mol Med, Kochi 682041, IndiaMathew, Ribu论文数: 0 引用数: 0 h-index: 0机构: VIT Bhopal Univ, Sch Elect & Elect Engn, Bhopal 466114, India Amrita Vishwa Vidyapeetham, Amrita Sch Nanosci & Mol Med, Kochi 682041, IndiaAjayan, J.论文数: 0 引用数: 0 h-index: 0机构: SR Univ, Dept Elect & Commun Engn, Warangal 506371, India Amrita Vishwa Vidyapeetham, Amrita Sch Nanosci & Mol Med, Kochi 682041, IndiaTayal, Shubham论文数: 0 引用数: 0 h-index: 0机构: SR Univ, Dept Elect & Commun Engn, Warangal 506371, India Amrita Vishwa Vidyapeetham, Amrita Sch Nanosci & Mol Med, Kochi 682041, IndiaNair, Shantikumar, V论文数: 0 引用数: 0 h-index: 0机构: Amrita Vishwa Vidyapeetham, Amrita Sch Nanosci & Mol Med, Kochi 682041, India Amrita Vishwa Vidyapeetham, Amrita Sch Nanosci & Mol Med, Kochi 682041, India
- [32] Direct fabrication of thin layer MoS2 field-effect nanoscale transistors by oxidation scanning probe lithographyAPPLIED PHYSICS LETTERS, 2015, 106 (10)Espinosa, Francisco M.论文数: 0 引用数: 0 h-index: 0机构: CSIC, Inst Ciencia Mat, Madrid, Spain CSIC, Inst Ciencia Mat, Madrid, SpainRyu, Yu K.论文数: 0 引用数: 0 h-index: 0机构: CSIC, Inst Ciencia Mat, Madrid, Spain CSIC, Inst Ciencia Mat, Madrid, SpainMarinov, Kolyo论文数: 0 引用数: 0 h-index: 0机构: LANES, Ecole Polytech Fed Lausanne, Lausanne, Switzerland CSIC, Inst Ciencia Mat, Madrid, SpainDumcenco, Dumitru论文数: 0 引用数: 0 h-index: 0机构: LANES, Ecole Polytech Fed Lausanne, Lausanne, Switzerland CSIC, Inst Ciencia Mat, Madrid, SpainKis, Andras论文数: 0 引用数: 0 h-index: 0机构: LANES, Ecole Polytech Fed Lausanne, Lausanne, Switzerland CSIC, Inst Ciencia Mat, Madrid, SpainGarcia, Ricardo论文数: 0 引用数: 0 h-index: 0机构: CSIC, Inst Ciencia Mat, Madrid, Spain CSIC, Inst Ciencia Mat, Madrid, Spain
- [33] Negative capacitance field-effect transistors based on ferroelectric AlScN and 2D MoS2APPLIED PHYSICS LETTERS, 2023, 123 (18)Song, Seunguk论文数: 0 引用数: 0 h-index: 0机构: Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAKim, Kwan-Ho论文数: 0 引用数: 0 h-index: 0机构: Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAChakravarthi, Srikrishna论文数: 0 引用数: 0 h-index: 0机构: Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAHan, Zirun论文数: 0 引用数: 0 h-index: 0机构: Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAKim, Gwangwoo论文数: 0 引用数: 0 h-index: 0机构: Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA Chungbuk Natl Univ, Dept Engn Chem, Chungbuk 28644, South Korea Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAMa, Kyung Yeol论文数: 0 引用数: 0 h-index: 0机构: Ulsan Natl Inst Sci & Technol UNIST, Dept Chem, UNIST Gil 50, Ulsan 44919, South Korea Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAShin, Hyeon Suk论文数: 0 引用数: 0 h-index: 0机构: Ulsan Natl Inst Sci & Technol UNIST, Dept Chem, UNIST Gil 50, Ulsan 44919, South Korea Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAOlsson, Roy H.论文数: 0 引用数: 0 h-index: 0机构: Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USAJariwala, Deep论文数: 0 引用数: 0 h-index: 0机构: Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA Univ Penn, Dept Elect & Syst Engn, Philadelphia, PA 19104 USA
- [34] Trapped charge modulation at the MoS2/SiO2 interface by a lateral electric field in MoS2 field-effect transistorsNANO FUTURES, 2019, 3 (01)Pak, Jinsu论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaCho, Kyungjune论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKim, Jae-Keun论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaJang, Yeonsik论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaShin, Jiwon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaKim, Jaeyoung论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaSeo, Junseok论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaChung, Seungjun论文数: 0 引用数: 0 h-index: 0机构: KIST, Photoelect Hybrids Res Ctr, Seoul 02792, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South KoreaLee, Takhee论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea
- [35] Impact of device scaling on the electrical properties of MoS2 field-effect transistorsSCIENTIFIC REPORTS, 2021, 11 (01)Arutchelvan, Goutham论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium Katholieke Univ Leuven, Leuven, Belgium IMEC, Leuven, BelgiumSmets, Quentin论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumVerreck, Devin论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumAhmed, Zubair论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumGaur, Abhinav论文数: 0 引用数: 0 h-index: 0机构: Katholieke Univ Leuven, Leuven, Belgium IMEC, Leuven, BelgiumSutar, Surajit论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumJussot, Julien论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumGroven, Benjamin论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumHeyns, Marc论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium Katholieke Univ Leuven, Leuven, Belgium IMEC, Leuven, BelgiumLin, Dennis论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumAsselberghs, Inge论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, BelgiumRadu, Iuliana论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium IMEC, Leuven, Belgium
- [36] Edge Contact for Carrier Injection and Transport in MoS2 Field-Effect TransistorsACS NANO, 2019, 13 (11) : 13169 - 13175Choi, Homin论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Dept Phys, Dept Energy Sci, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South KoreaMoon, Byoung Hee论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South KoreaKim, Jung Ho论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Dept Phys, Dept Energy Sci, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South KoreaYun, Seok Joon论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Dept Phys, Dept Energy Sci, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South KoreaHan, Gang Hee论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South KoreaLeep, Sung-gyu论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Dept Phys, Dept Energy Sci, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South KoreaGul, Hamza Zad论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Dept Phys, Dept Energy Sci, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South KoreaLee, Young Hee论文数: 0 引用数: 0 h-index: 0机构: Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea Sungkyunkwan Univ, Dept Phys, Dept Energy Sci, Suwon 16419, South Korea Sungkyunkwan Univ, Inst Basic Sci, Ctr Integrated Nanostruct Phys, Suwon 16419, South Korea
- [37] Microscopic origin of low frequency noise in MoS2 field-effect transistorsAPL MATERIALS, 2014, 2 (09):Ghatak, Subhamoy论文数: 0 引用数: 0 h-index: 0机构: Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, IndiaMukherjee, Sumanta论文数: 0 引用数: 0 h-index: 0机构: Indian Inst Sci, Solid State Struct Chem Unit, Bangalore 560012, Karnataka, India Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India论文数: 引用数: h-index:机构:Sarma, D. D.论文数: 0 引用数: 0 h-index: 0机构: Indian Inst Sci, Solid State Struct Chem Unit, Bangalore 560012, Karnataka, India Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India论文数: 引用数: h-index:机构:
- [38] Reexamination of the Schottky Barrier Heights in Monolayer MoS2 Field-Effect TransistorsACS APPLIED NANO MATERIALS, 2019, 2 (08) : 4717 - 4726Pan, Yuanyuan论文数: 0 引用数: 0 h-index: 0机构: China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R China Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaGu, Jihuan论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaTang, Hao论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaZhang, Xiuying论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaLi, Jingzhen论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaShi, Bowen论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaYang, Jie论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaZhang, Han论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaYan, Jiahuan论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaLiu, Shiqi论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaHu, Han论文数: 0 引用数: 0 h-index: 0机构: China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaWu, Mingbo论文数: 0 引用数: 0 h-index: 0机构: China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R ChinaLu, Jing论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China Collaborat Innovat Ctr Quantum Matter, Beijing 100871, Peoples R China Beijing Key Lab Magnetoeletr Mat & Devices BKL ME, Beijing 100871, Peoples R China China Univ Petr East China, Coll Chem Engn, State Key Lab Heavy Oil Proc, Inst New Energy, Qingdao 266580, Shandong, Peoples R China
- [39] Abnormal device performance in transferred multilayer MoS2 field-effect transistors2021 INTERNATIONAL SEMICONDUCTOR CONFERENCE (CAS), 2021, : 187 - 190Tong, Ling论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaMa, Jingyi论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaChen, Xinyu论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaGuo, Xiaojiao论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaGou, Saifei论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaXia, Yin论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaWang, Die论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaChen, Honglei论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R ChinaBao, Wenzhong论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China
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