Nonlinear transport properties of atomic copper point contacts

We report studies on the nonlinear electronic transport properties of copper point contacts. Utilizing the mechanically controllable break junction technique, various contact sizes can be realized to study ensemble-averaged differential conductance spectra at low temperatures. We investigate signatures of phonon excitations for contact sizes down to the atomic scale, where conductance fluctuations arise superimposing the phonon signatures. Applying high bias voltages to atomic-size copper contacts reveal additional features caused by atomic rearrangements.