Fast Frequency Characterization of Inductive Voltage Transformers Using Damped Oscillatory Waves

被引:1
|
作者
Crotti, Gabriella [1 ]
D'Avanzo, Giovanni [2 ]
Delle Femine, Antonio [3 ]
Gallo, Daniele [3 ]
Iodice, Claudio [3 ]
Landi, Carmine [3 ]
Letizia, Palma Sara [1 ]
Luiso, Mario [3 ]
机构
[1] Ist Nazl Ric Metrol, Div Metrol Mat Innovat & Sci Vita, I-10135 Turin, Italy
[2] Ric Sistema Energet SpA, Dipartimento Tecnol Trasmiss & Distribuz TTD, I-20134 Milan, Italy
[3] Univ Campania Luigi Vanvitelli, Dipartimento Ingn, I-81031 Aversa, Italy
关键词
Damped oscillatory waves; harmonics; inductive voltage transformers (VTs); instrument transformers (ITs); interharmonics; transient phenomena; SYSTEM;
D O I
10.1109/TIM.2023.3343773
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Measurements of harmonics and, in general, of power quality in distribution grids are becoming more and more an essential task, due to the proliferation of switching power devices. Instrument transformers (ITs), which are necessary for these kinds of measurements in distribution grids, in turn, need to be frequency characterized. Although international standards about ITs do not suggest procedures for their frequency characterization, there are some characterization procedures that are acknowledged in the scientific literature. They are based on the application of realistic power system waveforms to the ITs, in order to test their behavior in conditions very similar to the actual operating conditions. A drawback of these procedures is the quite long duration of the tests, in the order of similar to 1-10 h. Therefore, this article proposes a new waveform for the frequency characterization of inductive voltage transformers (VTs), composed by the superposition of a fundamental component and a periodic transient phenomenon, namely, a damped sine wave. With its use, it is possible, with a single waveform, to evaluate the frequency behavior of an inductive VT, thus with a test duration in the order of similar to 1 s. The waveform is theoretically analyzed and experimentally applied to two commercial VTs for medium-voltage distribution grids. Results are compared with those obtained with the IT frequency characterization methods most acknowledged in scientific literature.
引用
收藏
页码:1 / 14
页数:14
相关论文
共 50 条
  • [41] Fast Characterization of Dispersion and Dispersion Slope of Optical Fiber Links Using Spectral Interferometry With Frequency Combs
    Supradeepa, V. R.
    Long, Christopher M.
    Leaird, Daniel E.
    Weiner, Andrew M.
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2010, 22 (03) : 155 - 157
  • [42] Characterization of interface states in MOS systems by using photonic high-frequency capacitance-voltage responses
    Song, SJ
    Kim, HT
    Chi, SS
    Kim, MS
    Chang, WS
    Cho, SD
    Shin, HT
    Kim, TE
    Kang, HJ
    Kim, DJ
    Kim, DM
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2002, 41 (06) : 892 - 895
  • [43] Temperature and frequency characterization of InAs nanowire and HfO2 interface using capacitance-voltage method
    Astromskas, Gvidas
    Storm, Kristian
    Caroff, Philippe
    Borgstrom, Magnus
    Lind, Erik
    Wernersson, Lars-Erik
    MICROELECTRONIC ENGINEERING, 2011, 88 (04) : 444 - 447
  • [44] Low-Frequency Characterization in Thermal Converters Using AC-Programmable Josephson Voltage Standard System
    Amagai, Yasutaka
    Maruyama, Michitaka
    Fujiki, Hiroyuki
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2013, 62 (06) : 1621 - 1626
  • [45] Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors
    Bruce, S
    Vandamme, LKJ
    Rydberg, A
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (09) : 1772 - 1773
  • [46] Characterization of micrometric and superficial residual stresses using high frequency surface acoustic waves generated by interdigital transducers
    Duquennoy, Marc
    Ouaftouh, Mohammadi
    Deboucq, Julien
    Lefebvre, Jean-Etienne
    Jenot, Frederic
    Ourak, Mohamed
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 2013, 134 (06): : 4360 - 4371
  • [47] Using vertical capacitance-voltage measurements for fast on-wafer characterization of epitaxial GaN-on-Si material
    Schuster, M.
    Wachowiak, A.
    Groh, L.
    Szabo, N.
    Merkel, U.
    Jahn, A.
    Mikolajick, T.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2015, 212 (12): : 2897 - 2902
  • [48] Non-inductive plasma start-up experiments on the TST-2 spherical tokamak using waves in the lower-hybrid frequency range
    Shinya, T.
    Takase, Y.
    Wakatsuki, T.
    Ejiri, A.
    Furui, H.
    Hiratsuka, J.
    Imamura, K.
    Inada, T.
    Kakuda, H.
    Kasahara, H.
    Kumazawa, R.
    Moeller, C.
    Mutoh, T.
    Nagashima, Y.
    Nakamura, K.
    Nakanishi, A.
    Oosako, T.
    Saito, K.
    Seki, T.
    Sonehara, M.
    Togashi, H.
    Tsuda, S.
    Tsujii, N.
    Yamaguchi, T.
    NUCLEAR FUSION, 2015, 55 (07)
  • [49] Analysis of a modular generator for high-voltage, high-frequency pulsed applications, using low voltage semiconductors (<1 kV) and series connected step-up (1:10) transformers
    Redondo, L. M.
    Silva, J. Fernando
    Margato, E.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (03):
  • [50] Fast Grid Voltage Synchronization using Modified Frequency-locked Loop in Single Phase Grid-connected Power Systems
    Hassanpour, H.
    Ehsanian, M.
    INTERNATIONAL JOURNAL OF ENGINEERING, 2021, 34 (06): : 1430 - 1437