Modelling of DC characteristics of power SiC-MOSFETs in SPICE

被引:0
|
作者
Bisewski, Damian [1 ]
Lubicz-Krosnicka, Emilia [2 ,3 ]
机构
[1] Uniwersytet Morski Gdyni, Katedra Elekt Morskiej, Ul Morska 81-87, PL-81225 Gdynia, Poland
[2] Uniwersytet Morski Gdyni, Katedra Elekt Morskiej, Gdynia, Poland
[3] Uniwersytetu Morskiego Gdyni, Wydzialu Elektrycznego, Gdynia, Poland
来源
PRZEGLAD ELEKTROTECHNICZNY | 2023年 / 99卷 / 09期
关键词
modelling; MOSFET; silicon carbide;
D O I
10.15199/48.2023.09.60
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper deals with the problem of computer modelling of characteristics and parameters of power MOSFETs made of silicon carbide (SiC). An original model of the considered transistor was formulated and implemented in the PSPICE program, which is based on the Shichman-Hodges model of the silicon MOS transistor modified by the authors. In comparison to other existing MOS transistor models embedded in popular computer programs as well as models described in literature, the developed model exhibits high accuracy. Furthermore, the proposed model features a relatively simple structure, meaning that it includes only a few parameters in its analytical description. The values of these parameters can be determined based on the information in the datasheets of transistor or measurement results. of DC
引用
收藏
页码:289 / 292
页数:4
相关论文
共 50 条
  • [21] Comprehensive Study on Gate Driver for SiC-MOSFETs with Gate Boost
    Yamaguchi, Koji
    Katsura, Kenshiro
    Yamada, Tatsuro
    Sato, Yukihiko
    IEEJ JOURNAL OF INDUSTRY APPLICATIONS, 2018, 7 (03) : 218 - 228
  • [22] SPICE MODELS POWER MOSFETS
    WILLIAMS, RK
    MASARRATI, I
    BUTANI, A
    EDN, 1995, 40 (05) : 84 - 86
  • [23] Simulating power MOSFETs with SPICE
    1600, Publ by Intertec International, Inc., Ventura, CA, USA
  • [24] Classification of Commercial SiC-MOSFETs Based on Time-Dependent Gate-current Characteristics
    Murakami, E.
    Takeshita, T.
    Oda, K.
    Kobayashi, M.
    Asayama, K.
    Okamoto, M.
    2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS, 2023,
  • [25] A Comparison of the Transient Behavior of the Drain Current Hysteresis in SiC-MOSFETs
    Unger, Christian
    Pfost, Martin
    2018 IEEE INTERNATIONAL CONFERENCE ON ELECTRICAL SYSTEMS FOR AIRCRAFT, RAILWAY, SHIP PROPULSION AND ROAD VEHICLES & INTERNATIONAL TRANSPORTATION ELECTRIFICATION CONFERENCE (ESARS-ITEC), 2018,
  • [26] Fast Method of Computations of Ripples in the Junction Temperature of Discrete Power SiC-MOSFETs at the Steady State
    Gorecki, Krzysztof
    Gorecki, Pawel
    APPLIED SCIENCES-BASEL, 2022, 12 (17):
  • [27] Improvement in the Channel Performance and NBTI of SiC-MOSFETs by Oxygen Doping
    Noguchi, M.
    Iwamatsu, T.
    Amishiro, H.
    Watanabe, H.
    Kita, K.
    Miura, N.
    2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2019,
  • [28] Threshold voltage instability of SiC-MOSFETs on various crystal faces
    Senzaki, Junji
    Shimozato, Atsushi
    Kojima, Kazutoshi
    Harada, Shinsuke
    Ariyoshi, Keiko
    Kojima, Takahito
    Tanaka, Yasunori
    Okumura, Hajinne
    SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 : 521 - +
  • [29] Substantial Reduction of Power Loss in a 14kVA Inverter Using Paralleled SiC-MOSFETs and SiC-SBDs
    Nakata, S.
    Kinouchi, S.
    Sawada, T.
    Oi, T.
    Oomori, T.
    SILICON CARBIDE AND RELATED MATERIALS 2008, 2009, 615-617 : 903 - 906
  • [30] The DC Behavioural Electrothermal Model of Silicon Carbide Power MOSFETs under SPICE
    Lakrim, Abderrazak
    Tahri, Driss
    2015 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT), 2015, : 2818 - 2823