Thermochromic properties of ZnO/VO2/ZnO films on soda lime silicate glass deposited by RF magnetron sputtering

被引:15
|
作者
Jin, Woochan [1 ,2 ]
Park, Kyounghee [1 ]
Cho, Jun Young [1 ]
Bae, Sung-Hwan [3 ]
Siyar, Muhammad [4 ]
Park, Chan [1 ,2 ]
机构
[1] Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 08826, South Korea
[2] Seoul Natl Univ, Res Inst Adv Mat RIAM, Seoul 08826, South Korea
[3] Kyungnam Univ, Dept Nano Sci & Engn, Chang Won 51767, South Korea
[4] Natl Univ Sci & Technol NUST, Sch Chem & Mat Engn, Islamabad 44000, Pakistan
基金
新加坡国家研究基金会;
关键词
VO2; Thermochromic; Smart window; Sputtering; Transfer matrix method; THIN-FILMS; VO2; FILMS; PERFORMANCE; TRANSITION; COATINGS;
D O I
10.1016/j.ceramint.2022.11.226
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A smart window based on VO2 is a promising thermochromic (TC) glass that can regulate heat flow through windows by solar modulation near room temperature. TC glasses with high visible-light transmittance and large difference in infrared transmittance between high-and low-temperature VO2 phases are required to save large amounts of energy in buildings. VO2-based multilayer films with a buffer layer and/or an anti-reflective (AR) layer are used when the films are deposited by sputtering. In this study, VO2-based multilayer films were pre-pared on soda lime glass using ZnO as both the buffer and the AR layers. The structure of the multilayer film was simulated using the optical constants measured from the deposited films. The effect of buffer and AR layers on the TC properties of VO2-based multilayer films prepared by sputtering was investigated by simulation of the multilayer structure and deposition of the films with the simulated structure. The TC properties were measured and compared with the calculated properties. Improved TC properties (luminous transmittance (Tlum) of-50%/ 46% (30 degrees C/80 degrees C) and solar modulation ability (Delta Tsol) of-14%), compared to those without the buffer and AR layer, were obtained from the ZnO/VO2/ZnO film deposited on glass. The calculated transmittances agree better with the measured ones when the optical constants measured directly from the deposited films are used and the roughnesses of the surface/interface of the multilayer films are considered in the calculation of the optical constants.
引用
收藏
页码:10437 / 10444
页数:8
相关论文
共 50 条
  • [31] Oxygen Effect on Structural and Optical Properties of ZnO Thin Films Deposited by RF Magnetron Sputtering
    Abdallah, Bassam
    Jazmati, Abdul Kader
    Refaai, Raeda
    MATERIALS RESEARCH-IBERO-AMERICAN JOURNAL OF MATERIALS, 2017, 20 (03): : 607 - 612
  • [32] Effect of Deposition Time on Properties of Nanostructured ZnO Thin Films Deposited by RF Magnetron Sputtering
    Sin, N. D. Md
    Mamat, M. H.
    Rusop, M.
    NANOSCIENCE, NANOTECHNOLOGY AND NANOENGINEERING, 2014, 832 : 460 - 465
  • [33] Crystallinity and photoluminescence properties of ZnO films on Zn buffer layers deposited by rf magnetron sputtering
    Lee, Chongmu
    Park, Anna
    Cho, Y. J.
    Kim, Hyounwoo
    Lee, J. G.
    HIGH-PERFORMANCE CERAMICS IV, PTS 1-3, 2007, 336-338 : 567 - +
  • [34] The properties of Ti-doped ZnO films deposited by simultaneous RF and DC magnetron sputtering
    Lin, SS
    Huang, JL
    Sajgalik, P
    SURFACE & COATINGS TECHNOLOGY, 2005, 191 (2-3): : 286 - 292
  • [35] ZnO:Al Thin Films Deposited by RF-Magnetron Sputtering with Tunable and Uniform Properties
    Miorin, E.
    Montagner, F.
    Battiston, S.
    Fiameni, S.
    Fabrizio, M.
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2011, 11 (03) : 2191 - 2195
  • [36] Influence of RF Power on Optical and Surface Properties of the ZnO Thin Films Deposited by Magnetron Sputtering
    Pat, Suat
    Senay, Volkan
    Ozen, Soner
    Korkmaz, Sadan
    Gecici, Birol
    JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2015, 10 (02) : 183 - 186
  • [38] p-ZnO Thin Films Deposited by RF-Magnetron Sputtering
    Zambom, L. S.
    Mansano, R. D.
    15TH LATIN AMERICAN WORKSHOP ON PLASMA PHYSICS (LAWPP 2014) AND 21ST IAEA TM ON RESEARCH USING SMALL FUSION DEVICES (RUSFD), 2015, 591
  • [39] Thickness dependence of microstructural evolution of ZnO films deposited by rf magnetron sputtering
    Yong Eui Lee
    Young Jin Kim
    Hyeong Joon Kim
    Journal of Materials Research, 1998, 13 : 1260 - 1265
  • [40] Optical characterization of ZnO thin films deposited by RF magnetron sputtering method
    Tang Ning
    Wang JinLiang
    Xu HengXing
    Peng HongYong
    Fan Chao
    SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, 2009, 52 (08): : 2200 - 2203