Degradation;
Bayes methods;
Analytical models;
Reliability;
Dispersion;
Fans;
Measurement units;
Deviance information criterion (DIC);
highest posterior density (HPD) credible interval;
posterior distribution;
posterior predictive p;
-value;
predictive inference;
PROCESS MODEL;
D O I:
10.1109/TR.2023.3304673
中图分类号:
TP3 [计算技术、计算机技术];
学科分类号:
0812 ;
摘要:
Degradation models are constructed for the observations of a quality characteristic related to the failure time of products. The failure time inference of the product is derived based on the first passage time to a specific threshold for the selected degradation model. The Bayesian analysis incorporated with valuable prior information from expert opinion or experience is a helpful approach, in particular for small sample sizes. However, most Bayesian research focuses more on the degradation model than the failure time inference. This study uses Bayesian predictive analysis based on the inverse Gaussian process with conjugate priors to deduce the failure time inference. The posterior inference of the parameters for the fixed-effect linear degradation model is derived in closed forms, and the full conditional posteriors are developed for the random-effect models using hierarchical modeling. The failure time inference associated with the degradation model and its goodness-of-fit test is suggested from a complete Bayesian perspective. The proposed failure time inference can be used for other degradation models with random effect. Two illustrative examples demonstrate the feasibility and advantages of the proposed Bayesian approach.
机构:
Autonomous Univ Ciudad Juarez, Dept Ind Engn & Mfg, Ciudad Juarez, MexicoAutonomous Univ Ciudad Juarez, Dept Ind Engn & Mfg, Ciudad Juarez, Mexico
Alberto Rodriguez-Picon, Luis
Patricia Rodriguez-Picon, Anna
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h-index: 0
机构:
Technol Inst Ciudad Juarez, Post Grad & Res Studies, Ciudad Juarez, MexicoAutonomous Univ Ciudad Juarez, Dept Ind Engn & Mfg, Ciudad Juarez, Mexico
Patricia Rodriguez-Picon, Anna
Alvarado-Iniesta, Alejandro
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h-index: 0
机构:
Autonomous Univ Ciudad Juarez, Dept Ind Engn & Mfg, Ciudad Juarez, MexicoAutonomous Univ Ciudad Juarez, Dept Ind Engn & Mfg, Ciudad Juarez, Mexico
机构:
Datadvance, Moscow
Institute for Information Transmission Problems, Russian Academy of Sciences, MoscowDatadvance, Moscow
Zaytsev A.A.
Burnaev E.V.
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h-index: 0
机构:
Premolab, Moscow Institute of Physics and Technology, MoscowDatadvance, Moscow
Burnaev E.V.
Spokoiny V.G.
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h-index: 0
机构:
Premolab, Moscow Institute of Physics and Technology, Moscow
Weierstrass Institute (WIAS), Berlin
Humboldt University of Berlin, BerlinDatadvance, Moscow
机构:
Hong Kong Polytech Univ, Dept Appl Math, Hong Kong, Hong Kong, Peoples R ChinaHong Kong Polytech Univ, Dept Appl Math, Hong Kong, Hong Kong, Peoples R China
Ye, Zhi-Sheng
Chen, Nan
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h-index: 0
机构:
Natl Univ Singapore, Dept Ind & Syst Engn, Singapore 119077, SingaporeHong Kong Polytech Univ, Dept Appl Math, Hong Kong, Hong Kong, Peoples R China