Numerical Analysis of the Effect of Retaining Ring Structure on the Chemical Mechanical Polishing Abrasive Motion State

被引:2
|
作者
Zhang, Siqi [1 ,2 ]
Liu, Yiran [2 ]
Li, Weimin [1 ,2 ,3 ]
Cao, Jun [4 ]
Huang, Jiaye [2 ]
Zhu, Lei [2 ,3 ]
Guan, Zijun [2 ]
机构
[1] Shanghai Univ, Sch Microelect, Shanghai 200444, Peoples R China
[2] Shanghai Inst IC Mat, Shanghai 200050, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
[4] East China Univ Sci & Technol, Sch Mech & Power Engn, Shanghai 200237, Peoples R China
关键词
chemical mechanical polishing; abrasive; retaining ring; size of grooves; quantity of grooves; numerical simulation; SLURRY FILM THICKNESS; REMOVAL RATE; SLOT DESIGNS; SILICON; PLANARIZATION; WAFER; CMP; WEAR; SIMULATION; PARTICLES;
D O I
10.3390/ma16010062
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Optimizing the retaining ring structure can improve the quality of Chemical Mechanical Polishing (CMP). This study establishes a two-dimensional Computational Fluid Dynamics-Discrete Element Method (CFD-DEM) model, while the model is validated by experiments. The results graphically demonstrate the influence of the retaining ring groove design on the motion of the slurry abrasive particles. The size of the retaining ring groove appears to have a threshold value, above which the abrasives start to have significant distribution in the wafer region. As the groove size continues to increase, the number of abrasives entering the ring increases abruptly and oscillates at specific nodes. The abrasive transfer rate increases with the number of grooves in the early stage but reaches a limit at a certain number of grooves. Meanwhile, the retaining ring position affects the transfer of the abrasives. This study provides a base for optimizing the design of retaining rings.
引用
收藏
页数:17
相关论文
共 50 条
  • [41] Chemical mechanical polishing of steel substrate using aluminum nanoparticles abrasive slurry
    Peng, De-Xing
    INDUSTRIAL LUBRICATION AND TRIBOLOGY, 2014, 66 (01) : 124 - 130
  • [42] The role of the physical properties of alumina abrasive in the chemical-mechanical polishing of copper
    Her, YS
    Smith, DM
    Mayton, MM
    Prendergast, JE
    Ramarajan, S
    Haraharaputhiran, M
    Babu, SV
    FINISHING OF ADVANCED CERAMICS AND GLASSES, 1999, 102 : 281 - 290
  • [43] Pad surface characterization and its effect on the tribological state in chemical mechanical polishing
    Kim, H
    Jeong, H
    Lee, E
    Shin, Y
    ADVANCES IN ABRASIVE TECHNOLOGY VI, 2004, 257-258 : 383 - 388
  • [44] Shape classification of fumed silica abrasive and its effects on chemical mechanical polishing
    Kim, Eungchul
    Lee, Jaewon
    Park, Younghun
    Shin, Cheolmin
    Yang, Jichul
    Kim, Taesung
    POWDER TECHNOLOGY, 2021, 381 : 451 - 458
  • [45] Development of fixed abrasive chemical mechanical polishing process for glass disk substrates
    Y. B. Tian
    Z. W. Zhong
    S. T. Lai
    Y. J. Ang
    The International Journal of Advanced Manufacturing Technology, 2013, 68 : 993 - 1000
  • [46] Development of fixed abrasive chemical mechanical polishing process for glass disk substrates
    Tian, Y. B.
    Zhong, Z. W.
    Lai, S. T.
    Ang, Y. J.
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2013, 68 (5-8): : 993 - 1000
  • [47] Effects of chemical slurries on fixed abrasive chemical-mechanical polishing of optical silicon substrates
    Yebing Tian
    Zhaowei Zhong
    Jun Hao Ng
    International Journal of Precision Engineering and Manufacturing, 2013, 14 : 1447 - 1454
  • [48] Effects of Chemical Slurries on Fixed Abrasive Chemical-mechanical Polishing of Optical Silicon Substrates
    Tian, Yebing
    Zhong, Zhaowei
    Ng, Jun Hao
    INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2013, 14 (08) : 1447 - 1454
  • [49] Temperature Distribution in Polishing Pad during CMP Process: Effect of Retaining Ring
    Lee, Hyunseop
    Guo, Yongchang
    Jeong, Haedo
    INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2012, 13 (01): : 25 - 31
  • [50] Temperature distribution in polishing pad during CMP process: Effect of retaining ring
    Hyunseop Lee
    Yongchang Guo
    Haedo Jeong
    International Journal of Precision Engineering and Manufacturing, 2012, 13 : 25 - 31