Electron mobility of heavily doped semiconductors including multiple scattering by ionized impurities

被引:1
|
作者
Rode, D. L. [1 ]
Cetnar, John S. [2 ]
机构
[1] Washington Univ, Dept Elect Engn, St Louis, MO 63130 USA
[2] US Air Force, Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
关键词
MULTIION SCATTERING; EPITAXIAL GAAS; TRANSPORT; COMPENSATION; GROWTH; PURITY;
D O I
10.1063/5.0165201
中图分类号
O59 [应用物理学];
学科分类号
摘要
A theoretical treatment of the multiple scattering problem for electrons in heavily doped semiconductors is developed for the purpose of resolving a long-standing discrepancy between theory and experiment on electron transport in semiconductors and semimetals. The scattering strength term in the traditional Brooks-Herring formula for ionized impurity scattering is modified to take into account the effect of the spatial proximity of ionized donors leading to an additional scattering term proportional to the cube of ionized impurity concentration, whereas the Brooks-Herring theory varies strictly linearly with the ionized impurity concentration. Comparisons between theory and experiment for GaAs, GaN, ZnO, and a-Sn are presented, showing significant improvement overall. In some cases, improvements greater than an order of magnitude are achieved. The agreement between theory and experiment for heavily doped ZnO over the temperature range of 21-322 K is within about 1%, depending on temperature.
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页数:12
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