One-shot reflectance direction color mapping for identifying surface roughness

被引：2

作者：

Ohno, Hiroshi ^{[1
]}

机构：

[1] Toshiba Co Ltd, Corp Res & Dev Ctr, Komukai Toshiba Cho 1,Saiwai Ku, Kawasaki 2128582, Japan

来源：

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2024年 / 85卷

关键词：

REFRACTIVE-INDEX FIELDS; RECONSTRUCTION METHOD; GRADIENT; OPTICS; SYSTEM;

D O I：

10.1016/j.precisioneng.2023.09.004

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Surface roughness, an important property of products, can be identified using the bidirectional reflectance distribution function (BRDF). A method to identify surface roughness is thus proposed using a one-shot reflectance direction color mapping imaging system. This imaging system can capture BRDF information across the entire field of view in one shot. Histograms of color variations in the captured images reveal that the surfaces with different roughness values on a metal piece can be identified even at a sub -micrometer scale.

引用

页码：65 / 71

页数：7

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