High Precision and Low Force Resonant Probe Based on Quartz Tuning Fork

被引:1
|
作者
Huang, Qiangxian [1 ,2 ]
Wang, Wenqian [1 ]
Wang, Guangpu [1 ]
Cheng, Rongjun [1 ,2 ]
Zhang, Liansheng [1 ,2 ]
Li, Hongli [1 ,2 ]
Li, Ruijun [1 ,2 ]
机构
[1] Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei 230009, Anhui, Peoples R China
[2] Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
Resonant trigger probe; Interatomic force; Nanometer resolution; Micro; nano measurement; CONTACT; IMPLEMENTATION; MICROSCOPY; ADHESION; SENSOR; MODE;
D O I
10.1007/s12541-023-00862-z
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To realize the high-precision three-dimensional (3D) measurement of micro-precision devices, a 3D resonant trigger probe based on quartz tuning fork for micro/nano coordinate measuring machine (CMM) is proposed. The probe is composed of a quartz tuning fork, a tapered optical fiber stylus and a microsphere. It vibrates in resonance state and makes contact with the measured surface in the Z direction in tapping mode, while in the X and Y directions, it operates in friction mode. The 3D nano-positioning of the probe is achieved by the changes in resonance parameter caused by the interatomic force between the microsphere and the surface of the measured sample. In this study, the diameter of the probe microsphere can be as low as 80 & mu;m, and the length of the probe stylus is approximately 5 mm. The trigger resolution of the probe in the X, Y and Z directions are 0.44, 0.41 and 0.34 nm, respectively. The probing forces in the X, Y and Z directions are 2.25, 1.81 and 4.24 & mu;N, respectively. Experimental results verify that the proposed probe has the advantages of small size, sub-nano resolution and very low probing force. This probe can be used as the trigger probe of micro/nano CMM, which can be triggered by interatomic force.
引用
收藏
页码:2073 / 2082
页数:10
相关论文
共 50 条
  • [31] A High Sensitivity Quartz Tuning Fork Temperature Sensor
    Xu, Jun
    You, Bo
    Li, Xin
    Ma, Jing
    2009 4TH IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1 AND 2, 2009, : 616 - +
  • [32] Quartz crystal double-ended tuning fork resonator for high resolution force sensing
    Wang, Jian
    Zhao, Cong
    Zhang, Shiming
    Zou, Jiangbo
    MICRO-NANO TECHNOLOGY XV, 2014, 609-610 : 1181 - 1184
  • [33] Split quartz tuning fork sensors for enhanced sensitivity force detection
    Labardi, M.
    Lucchesi, M.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2015, 26 (03)
  • [34] Mutual friction force with oscillations of a quartz tuning fork in superfluid helium
    Mykhailenko, K.A.
    Sokolov, S.S.
    Sheshin, G.A.
    Fizika Nizkikh Temperatur, 2019, 45 (10): : 1235 - 1241
  • [35] Hydrogel tip attached quartz tuning fork for shear force microscopy
    Ko J.
    Jarzembski A.
    Park K.
    Lee J.
    Micro and Nano Systems Letters, 6 (1)
  • [36] Femto-Newton force sensitivity quartz tuning fork sensor
    Barbic, Mladen
    Eliason, Lowell
    Ranshaw, James
    SENSORS AND ACTUATORS A-PHYSICAL, 2007, 136 (02) : 564 - 566
  • [37] Mutual friction force with quartz tuning fork oscillations in superfluid helium
    Mykhailenko, K. A.
    Sokolov, S. S.
    Sheshin, G. A.
    LOW TEMPERATURE PHYSICS, 2019, 45 (10) : 1053 - 1058
  • [38] Compensation of stray capacitance of the quartz tuning fork for a quantitative force spectroscopy
    An, Sangmin
    Lee, Kunyoung
    Kim, Bongsu
    Kim, Jongwoo
    Kwon, Soyoung
    Kim, Qhwan
    Lee, Manhee
    Jhe, Wonho
    CURRENT APPLIED PHYSICS, 2013, 13 (09) : 1899 - 1905
  • [39] Quartz tuning fork-A potential low temperature thermometer in high magnetic fields
    Clovecko, M.
    Skyba, P.
    APPLIED PHYSICS LETTERS, 2019, 115 (19)
  • [40] Amplitude calibration of quartz tuning fork (QTF) force sensor with an atomic force microscope
    Hussain, Danish
    Zhang, Hao
    Song, Jianmin
    Wen Yongbing
    Meng, Xianghe
    Fan Xinjian
    Xie, Hui
    2017 IEEE 17TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO), 2017, : 373 - 378