Dynamic analysis of the different types of elliptic cylindrical inclusions subjected to plane SH-wave scattering

The complex boundary of the elliptical inclusion rendered it difficult to solve the problem of wave scattering. In this study, the steady-state response was analyzed using the wave function expansion method. Subsequently, the Ricker wavelet was employed as the transient disturbance, and Fourier transform was used to determine the distribution of transient dynamic stress concentration around the elliptical inclusion. The effects of wave number, elliptical axial ratio, and difference in material properties on the distribution of the dynamic stress concentration around the elliptical inclusion were evaluated. The numerical results revealed that the dynamic stress concentration always appeared at both ends of the major axis and minor axis of the elliptical inclusion, and the difference in material properties between the inclusion and medium influenced the variations in the dynamic stress concentration factor with the wave number and elliptical axial ratio.