8.7 A/700 V β-Ga2O3 Schottky barrier diode demonstrated by oxygen annealing combined with self-aligned mesa termination

被引:5
|
作者
Wu, Feihong [1 ]
Han, Zhao [1 ]
Liu, Jinyang [1 ]
Wang, Yuangang [2 ]
Hao, Weibing [1 ]
Zhou, Xuanze [1 ]
Xu, Guangwei [1 ]
Lv, Yuanjie [2 ]
Feng, Zhihong [2 ]
Long, Shibing [1 ]
机构
[1] Univ Sci & Technol China, Sch Microelect, Hefei 230026, Peoples R China
[2] Hebei Semicond Res Inst, Natl Key Lab Solid State Microwave Devices & Circu, Shijiazhuang 050051, Peoples R China
基金
中国国家自然科学基金;
关键词
beta-Ga2O3; SBD; oxygen annealing; mesa termination; power device; SURGE-CURRENT; RESISTANCE;
D O I
10.35848/1882-0786/ad2d73
中图分类号
O59 [应用物理学];
学科分类号
摘要
beta-Ga2O3 Schottky barrier diodes (SBDs) with low-defect epitaxial surface and effective termination are essential for realizing excellent blocking characteristics. This work systematically studied oxygen annealing at various temperatures, optimizing the epitaxial surface by reducing the surface roughness and dislocation density. Combined with mesa termination, the results showed that the breakdown voltage (V-br) significantly increased from 845 V to 1532 V. The device with a 3 x 3 mm(2) anode size was fabricated simultaneously, and the high forward currents of 8.7 A@2 V and V-br > 700 V were achieved. This work shows a possible solution for the commercialization of beta-Ga2O3 SBDs.
引用
收藏
页数:5
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