Influence of Local Electropolishing Conditions on Ferritic-Pearlitic Steel on X-Ray Diffraction Residual Stress Profiling

被引:0
|
作者
Holmberg, Jonas [1 ]
Berglund, Johan [1 ]
Stormvinter, Albin [1 ]
Andersson, Par [1 ]
Lundin, Per [2 ]
机构
[1] RISE Res Inst Sweden AB, Gothenburg, Sweden
[2] Ludin Stress Serv AB, Stockholm, Sweden
关键词
electrolytical polishing; perchloric acid; profile; residual stress; saturated salt; LAYER REMOVAL;
D O I
10.1007/s11665-023-08525-w
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Layer removal with electropolishing is a well-established method when measuring residual stress profiles with lab-XRD. This is done to measure the depth impact from processes such as shot peening, heat treatment, or machining. Electropolishing is used to minimize the influence on the inherent residual stresses of the material during layer removal, performed successively in incremental steps to specific depths followed by measurement. Great control of the material removal is critical for the measured stresses at each depth. Therefore, the selection of size of the measurement spot and electropolishing parameters is essential. The main objective in this work is to investigate how different electrolytes and electropolishing equipment affect the resulting surface roughness, geometry, microstructure, and consequently the measured residual stress. A second objective has been to establish a methodology of assessing the acquired electropolished depth. The aim has been to get a better understanding of the influence of the layer removal method on the accuracy of the acquired depth. Evaluation has been done by electropolishing one ground and one shot peened sample of a low-alloy carbon steel, grade 1.1730, with different methods. The results showed a difference in stresses depending on the electrolyte used where the perchloric acid had better ability to retain the stresses compared to the saturated salt. Electropolishing with saturated salt is fast and results in evenly distributed material removal but has high surface roughness, which is due to a difference in electropolishing of the two phases, ferrite, and pearlite. Perchloric acid electropolishing is slower but generates a smooth surface as both ferrite and pearlite have the same material removal rates but may cause an increased material removal for the center of the electropolished area. In this work, it is suggested to use perchloric acid electropolishing for the final layer removal step.
引用
收藏
页码:3682 / 3690
页数:9
相关论文
共 50 条
  • [21] Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction
    Durand, N
    Badawi, KF
    Goudeau, P
    THIN SOLID FILMS, 1996, 275 (1-2) : 168 - 171
  • [22] Evaluation of Residual Stress by X-Ray Diffraction and Correlative Stress Modelling
    Kumar, Sandeep
    Crivoi, Alexandru
    Tan, Ming Jen
    Tai, Anna
    Marinescu, Iulian
    RESIDUAL STRESSES 2016: ICRS-10, 2017, 2 : 211 - 216
  • [23] Residual stress determination in cold drawn steel wire by FEM simulation and X-ray diffraction
    He, S
    Van Bael, A
    Li, SY
    Van Houtte, P
    Mei, F
    Sarban, A
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 346 (1-2): : 101 - 107
  • [24] Residual stress determination in cold drawn steel wire by FEM simulation and X-ray diffraction
    Van Houtte, P
    He, S
    Mei, F
    Sarban, A
    ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2002, 404-7 : 205 - 212
  • [25] Residual stress determination in microsystems using X-ray diffraction
    Kämpfe, B
    Kämpfe, A
    Auerswald, E
    Kassem, ME
    MICRO MATERIALS, PROCEEDINGS, 2000, : 695 - 699
  • [26] RESIDUAL-STRESS ANALYSIS USING X-RAY DIFFRACTION
    BAUCUM, WE
    EXPERIMENTAL MECHANICS, 1971, 11 (05) : N36 - &
  • [27] Residual stress in particulate epoxy resin by x-ray diffraction
    Nishino, Takashi
    Airu, Xu
    Matsumoto, Takeshi
    Matsumoto, Kanki
    Nakamae, Katsuhiko
    Journal of Applied Polymer Science, 1992, 45 (07): : 1239 - 1244
  • [28] Study of residual stress relaxation using X-ray diffraction
    Cheong, WCD
    Zhuang, WZ
    Zhang, LC
    ADVANCES IN ENGINEERING PLASTICITY AND ITS APPLICATIONS, PTS 1 AND 2, 2004, 274-276 : 871 - 876
  • [29] X-ray Diffraction Analysis of Residual Stress in Laminated Ceramic
    Jin, Young Ho
    Chung, Dong Yoon
    JOURNAL OF THE KOREAN CERAMIC SOCIETY, 2011, 48 (05) : 458 - 462
  • [30] Measurement of residual stresses in a multi-pass low alloy ferritic steel weld using X-ray diffraction
    McDonald, EJ
    Exworthy, LF
    Flewitt, PEJ
    Hallam, K
    Bell, W
    ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2000, 347-3 : 664 - 669