n-type CdTe:In for photovoltaics: in situ doping, type verification and compensation effects

被引:1
|
作者
Hobson, Theodore D. C. [1 ]
Thomas, Luke [1 ]
Phillips, Laurie J. [1 ]
Jones, Leanne A. H. [1 ,4 ]
Smiles, Matthew J. [1 ]
Don, Christopher H. [1 ]
Thakur, Pardeep K. [2 ]
Shiel, Huw [1 ,5 ]
Campbell, Stephen [3 ]
Barrioz, Vincent [3 ]
Dhanak, Vin [1 ]
Veal, Tim [1 ]
Major, Jonathan D. [1 ]
Durose, Ken [1 ]
机构
[1] Univ Liverpool, Stephenson Inst Renewable Energy, Dept Phys, Liverpool L69 7ZF, England
[2] Diamond Light Source, Harwell Sci & Innovat Campus, Didcot OX11 0DE, Oxon, England
[3] Northumbria Univ, Dept Math Phys & Elect Engn, Newcastle Upon Tyne NE1 8ST, England
[4] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
[5] Imperial Coll London, Dept Mat, Prince Consort Rd, London SW7 2BP, England
来源
JOURNAL OF PHYSICS-ENERGY | 2023年 / 5卷 / 04期
关键词
CdTe; photovoltaics; n-type; in-situ doping; photoemission; LIFETIME;
D O I
10.1088/2515-7655/acfbf8
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We explored the in-situ doping of cadmium telluride thin films with indium to produce n-type absorbers as an alternative to the near-universal choice of p-type for photovoltaic devices. The films were grown by close space sublimation from melt-synthesised feedstock. Transfer of the indium during film growth was limited to 0.0014%-0.014%-unless reducing conditions were used which yielded 14%-28% efficient transport. While chunks of bulk feedstock were verified as n-type by the hot probe method, carrier type of thin film material was only able to be verified by using hard x-ray photoelectron spectroscopy to determine the Fermi level position within the band gap. The assignment of n-type conductivity was consistent with the rectification behaviour of a p-InP/CdTe:In junction. However, chloride treatment had the effect of compensating n-CdTe:In to near-intrinsic levels. Without chloride, the highest dopant activation was 20% of the chemical concentration of indium, this being for a film having a carrier concentration of n = 2 x 10(15) cm(-3). However, the activation was often much lower, and compensation due to over-doping with indium and native defects (stoichiometry) are discussed. Results from preliminary bifacial devices comprising Au/P3HT/ZnTe/CdTe:In/CdS/FTO/glass are presented.
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页数:12
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