Structural and optical properties of smooth radio frequency sputtered XTe (X=Cd, Zn) thin films

被引：3

作者：

Elmourabit, F. ^{[1
]}

Dlimi, S. ^{[1
]}

Ouissaaden, F. Id ^{[1
]}

Khoukh, A. ^{[1
]}

Amiri, L. ^{[2
]}

Nkhaili, L. ^{[2
]}

Limouny, L. ^{[3
]}

Narjis, A. ^{[4
]}

机构：

[1] Chouaib Doukkali Univ, Fac Sci, Phys Dept, Lab Sci & Technol Informat & Commun LSTIC,Team Mic, Av Fac, El Jadida 24000, Morocco

[2] Univ Cadi Ayyad, Fac Sci Semlalia, Lab Mat Energy & Environm LaMEE, POB 2390, Marrakech 40000, Morocco

[3] Moulay Ismail Univ, Fac Sci & Tech Errachidia, Phys Dept, ENIM,LSTI, Meknes, Morocco

[4] Ibn Zohr Univ, Lab Mat & Renewable Energies LMER, BP 1136, Agadir 80000, Morocco

来源：

PHYSICA B-CONDENSED MATTER | 2023年 / 666卷

关键词：

ZnTe thin films; CdTe thin films; RF sputtering; Structural properties; Optical properties; SOLAR-CELLS; SEMICONDUCTORS; SPECTROSCOPY; EFFICIENCY;

D O I：

10.1016/j.physb.2023.415058

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Zinc telluride (ZnTe) and cadmium telluride (CdTe) thin films, with smooth surfaces, were prepared by the radio frequency sputtering method. X-ray diffaction patterns revealed the formation of pure cubic phases and allowed the access of the structural properties. The lattice mismash between the two compounds is found to be around 6%.UV-visible spectroscopy showed a significant absorption coefficient within the visible spectrum, accompanied by an energy band gap measuring 1.9 eVfor the ZnTe film and 1.42 eV for the CdTe film. This study may be benificial for using these materials together of separately in photovoltaic and photocatalytic devices.

引用

页数：7

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