Stress-Free Highly Reflective Multilayer Mo/Be/Si Mirrors for Operation in the Vicinity of the Wavelength 13.5 nm

被引:0
|
作者
Smertin, R. M. [1 ]
Zuev, S. Yu. [1 ]
Polkovnikov, V. N. [1 ]
Chkhalo, N. I. [1 ]
机构
[1] Russian Acad Sci, Inst Phys Microstruct, Nizhnii Novgorod 607680, Russia
来源
JOURNAL OF SURFACE INVESTIGATION | 2023年 / 17卷 / SUPPL 1期
基金
俄罗斯科学基金会;
关键词
multilayer mirrors; X-ray radiation; extreme ultraviolet (EUV) lithography; maskless lithography; internal stresses; FILMS; MO;
D O I
10.1134/S1027451023070492
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Multilayer Mo/Be/Si mirrors with different ratios of Si- and Be-layer thicknesses in a period are considered. It is shown that the substitution of silicon with beryllium in the Mo/Si system makes it possible to completely eliminate internal stresses in the Mo/Be/Si structure. Layer thicknesses are found (Si similar to 0.9 nm, Mo similar to 2.8 nm, and Be similar to 3.3 nm) that simultaneously provide high reflection coefficients (R similar to 66-67%) at a wavelength of 13.5 nm and zero values of internal stresses.
引用
收藏
页码:S239 / S243
页数:5
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