Single Event Effects Results for COTS Microcontrollers and Microprocessors

被引：0
|
作者：
Vartanian, Sergeh [1 ]
Allen, Gregory R. [1 ]
Irom, Farokh [1 ]
Daniel, Andrew [1 ]
Zajac, Stephanie [1 ]
机构：
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
来源：
2023 IEEE RADIATION EFFECTS DATA WORKSHOP, REDW IN CONJUNCTION WITH 2023 NSREC | 2023年
基金：
美国国家航空航天局;
关键词：
D O I：
10.1109/REDW61050.2023.10265843
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present single event effects (SEE) results for a variety of microcontrollers and microprocessors. The devices tested include Blackfin embedded processors from Analog Devices, automotive-grade TI and Infineon microcontrollers with multiple safety features, and the MSP430FR5994.
引用
收藏
页码：78 / 82
页数：5
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