Characterization of pure and Cu doped V2O5 nanostructures and their Cu:V2O5/p-Si photodiode applications

被引:6
|
作者
Kumar, N. S. [1 ]
Babu, B. [2 ]
Gowtham, M. [1 ]
Sivakumar, C. [3 ]
Ho, M. S. [2 ,3 ]
Chang, J. H. [4 ]
Mohanraj, K. [4 ]
机构
[1] Kongunadu Arts & Sci Coll, Dept Phys, Coimbatore 641029, Tamil Nadu, India
[2] Natl Chung Hsing Univ, Dept Phys, Taichung 40227, Taiwan
[3] Natl Chung Hsing Univ, Innovat & Dev Ctr Sustainable Agr IDCSA, Taichung 40227, Taiwan
[4] Chaoyang Univ Technol, Dept Environm Engn & Management, Taichung 413310, Taiwan
关键词
Phase change; Doping; Morphological; Schottky diode; THIN-FILMS; NANOPARTICLES; TEMPERATURE; REDUCTION; MIS;
D O I
10.15251/DJNB.2023.181.131
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study, a wet chemical approach was exploited to synthesis of Cu-doped V2O5 (CVO) nanostructures with different doping concentrations of Cu at 5, 10, and 15%. The structural analysis confirms that samples annealed at 600oC rehabilitated to monoclinic V2O5. The surface morphology and nanostructure were studied by SEM and TEM analysis. The presence of various elements (Cu, V & O) and their compositions were confirmed using EDS and XPS measurements. The photoluminescence spectrum reveals a strong blue emission at 418 nm is ascribed to the electronic transition from vanadium interstitial to the valence band. Further, we fabricated the junction diodes by the nebulizer spray depositing CVO nanostructures in a colloidal form on the p-Si substrate at 150oC. Depending on the applied voltage and Cu doping level the rectifying behavior with a high rectification ratio (RR) was observed from the I-V characteristics of studied diodes. Inclusively, a V2O5 with substitution of Cu at.15% has significantly enhanced the photoresponse time and current density (J=4.19x10-4A/cm2).
引用
收藏
页码:131 / 143
页数:13
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