A derivation of the electrical capacitance tomography sensitivity matrix

被引：10
|
作者：
Youngquist, Robert C. [1 ]
Storey, Jedediah M. [2 ]
Nurge, Mark A. [1 ]
Biagi, Christopher J. [1 ]
机构：
[1] NASA, Appl Phys Lab, Kennedy Space Ctr, Mail Code UB-G2, Merritt Isl, FL 32899 USA
[2] NASA, Environm & Launch Approval Branch, Kennedy Space Ctr, Mail Code VA-H3, Merritt Isl, FL 32899 USA
来源：
MEASUREMENT SCIENCE AND TECHNOLOGY | 2023年 / 34卷 / 02期
关键词：
electrical capacitance tomography; sensitivity matrix; high-contrast permittivity; IMAGE-RECONSTRUCTION;
D O I：
10.1088/1361-6501/aca0b1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The sensitivity matrix, used in electrical capacitance tomography to connect capacitance readings to a dielectric distribution, is derived without assumptions on the magnitude of the relative permittivity and without dropping higher order terms. Deriving this matrix may provide a means to improve the performance of the various published electrical capacitance tomography algorithms and extend their applicability to a wider range of dielectric materials.
引用
收藏
页数：8
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