Atomically Resolved Scanning Tunneling Microscopy of Cleaved Chalcopyrite Surface

被引：0

作者：

Kikuchi, Kenya ^{[1
]}

Kurokawa, Shu ^{[1
]}

Taninouchi, Yu-ki ^{[2
]}

机构：

[1] Kyoto Univ, Dept Mat Sci & Engn, Kyoto 6068501, Japan

[2] Kyushu Univ, Dept Mat, Fukuoka 8190395, Japan

来源：

MATERIALS TRANSACTIONS | 2023年 / 64卷 / 12期

关键词：

chalcopyrite; surface; scanning tunneling microscopy; FERRIC ION; ADSORPTION; MECHANISM; KINETICS;

D O I：

10.2320/matertrans.M-M2023810

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Information on the microstructure of copper minerals is important for more detailed understanding and control of the Cu extraction processes such as flotation and direct leaching. For the first time, scanning tunneling microscopy (STM) observation with atomic resolution on CuFeS2 surfaces has been achieved using cleaved natural chalcopyrite crystals at low temperatures. The surfaces with (011) and (012) orientations have been identified by STM observation, electron backscattering, and X-ray diffraction. (011) surfaces of two different types were observed. The one is a reconstructed surface, and the other surface has a structure that is close to that of a bulk terminated surface. [doi:10.2320/matertrans.M-M2023810]

引用

页码：2748 / 2753

页数：6

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