Distribution-free image monitoring with application to battery coating process
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作者:
Gong, Tingnan
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Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Gong, Tingnan
[1
]
Liu, Di
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Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Liu, Di
[1
]
Kim, Heeseon
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机构:
LG Elect, Seoul, South KoreaGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Kim, Heeseon
[2
]
Kim, Seong-Hee
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机构:
Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Kim, Seong-Hee
[1
]
Kim, Taeheung
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LG Elect, Seoul, South KoreaGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Kim, Taeheung
[2
]
Lee, Dongki
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LG Elect, Seoul, South KoreaGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Lee, Dongki
[2
]
Xie, Yao
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Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Xie, Yao
[1
]
机构:
[1] Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
Statistical process control;
CUSUM;
image monitoring;
distribution free;
nonparametric statistical methods;
LINEAR PROFILES;
CONTROL CHARTS;
D O I:
10.1080/24725854.2024.2308542
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
This article presents a distribution-free image monitoring procedure for a manufacturing process, where a series of images are converted into a vector of two feature values extracted from singular value decomposition. Traditional image-based monitoring methods often make specific assumptions about marginal distributions and spatio-temporal dependence structures, which are often violated in real-world scenarios such as battery coating processes. To overcome this issue, we propose a distribution-free image monitoring procedure that detects a shift in the mean matrix of monitored images. Our method involves performing singular value decomposition of each image matrix in two ways to obtain two values, which are then combined into a bivariate vector. The bivariate vectors are monitored using a distribution-free multivariate CUSUM procedure, for which we determine control limits analytically, enabling convenient and easy implementation of the monitoring procedure. We demonstrate the effectiveness of our proposed procedure, as measured by average run lengths, using various simulated data and a real-data example from a battery coating process.
机构:
Nanjing Univ Posts & Telecommun, Sch Management, Nanjing, Peoples R China
Jiangsu Informat Ind Integrat Innovat & Emergency, Key Res Base Philosophy & Social Sci, Nanjing, Peoples R ChinaNanjing Univ Posts & Telecommun, Sch Management, Nanjing, Peoples R China
Tang, Anan
Mukherjee, Amitava
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机构:
XLRI Jamshedpur, XLRI Xavier Sch Management, Jamshedpur, IndiaNanjing Univ Posts & Telecommun, Sch Management, Nanjing, Peoples R China
机构:
Univ Tunku Abdul Rahman, Fac Sci, Dept Phys & Math Sci, Kampar, Perak, MalaysiaUniv Tunku Abdul Rahman, Fac Sci, Dept Phys & Math Sci, Kampar, Perak, Malaysia
Chong, Z. L.
Mukherjee, A.
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机构:
XLRI Xavier Sch Management, Prod Operat & Decis Sci Area, Xlri Jamshedpur, IndiaUniv Tunku Abdul Rahman, Fac Sci, Dept Phys & Math Sci, Kampar, Perak, Malaysia
Mukherjee, A.
Khoo, Michael B. C.
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机构:
Univ Sains Malaysia, Sch Math Sci, George Town, MalaysiaUniv Tunku Abdul Rahman, Fac Sci, Dept Phys & Math Sci, Kampar, Perak, Malaysia