Top contact organic field effect transistors fabricated using a photolithographic process

被引:0
|
作者
王宏 [1 ,2 ]
姬濯宇 [2 ]
商立伟 [2 ]
刘兴华 [2 ]
彭应全 [1 ]
刘明 [2 ]
机构
[1] Institute of Microelectronics,School of Physical Science and Technology,Lanzhou University
[2] Laboratory of Nano-Fabrication and Novel Devices Integrated Technology,Institute of Microelectronics,Chinese Academy of Sciences
基金
中国国家自然科学基金;
关键词
organic field effect transistors; top contact; photolithographic;
D O I
暂无
中图分类号
TN386 [场效应器件];
学科分类号
0805 ; 080501 ; 080502 ; 080903 ;
摘要
This paper proposes an effective method of fabricating top contact organic field effect transistors by using a pho-tolithographic process.The semiconductor layer is protected by a passivation layer.Through photolithographic and etching processes,parts of the passivation layer are etched off to form source/drain electrode patterns.Combined with conventional evaporation and lift-off techniques,organic field effect transistors with a top contact are fabricated suc-cessfully,whose properties are comparable to those prepared with the shadow mask method and one order of magnitude higher than the bottom contact devices fabricated by using a photolithographic process.
引用
收藏
页码:393 / 397
页数:5
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