Investigation on the interaction length and access resistance of a nanopore with an atomic force microscopy

被引:0
|
作者
SI Wei [1 ]
YANG HaoJie [1 ]
LI Kun [1 ]
WU GenSheng [1 ]
ZHANG Yin [1 ]
KAN YaJing [1 ]
XIE Xiao [2 ]
SHA JingJie [1 ]
LIU Lei [1 ]
CHEN YunFei [1 ]
机构
[1] Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments and School of Mechanical Engineering, Southeast University
[2] Key Laboratory of MEMS of Ministry of Education, Southeast University
基金
中国国家自然科学基金; 中央高校基本科研业务费专项资金资助;
关键词
solid-state nanopore; ionic current; access resistance; interaction length; AFM; capture radius;
D O I
暂无
中图分类号
TB383.1 [];
学科分类号
070205 ; 080501 ; 1406 ;
摘要
Nanopore devices have attracted a lot of attention for their potential application in DNA sequencing. Here, we study how an occluding object placed near a nanopore affects its access resistance by integrating an atomic force microscopy with a nanopore sensor. It is found that there exists a critical hemisphere around the nanopore, inside which the tip of an atomic force microscopy will affect the ionic current. The radius of this hemisphere, which is a bit smaller than the theoretical capture radius of ions, increases linearly with the applied bias voltage and quadratically with the nanopore diameter, but is independent of the operation modes and scanning speeds of the atomic force microscopy. A theoretical model is also proposed to describe how the tip position and geometrical parameters affect the access resistance.
引用
收藏
页码:552 / 560
页数:9
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