Band alignment of Ga2O3/6H-SiC heterojunction

被引:0
|
作者
常少辉 [1 ]
陈之战 [1 ]
黄维 [1 ]
刘学超 [1 ]
陈博源 [1 ]
李铮铮 [1 ]
施尔畏 [1 ]
机构
[1] Shanghai Institute of Ceramics,Chinese Academy of Sciences
基金
中国国家自然科学基金;
关键词
band alignment; Ga2O3/6H-SiC; synchrotron radiation photoelectron spectroscopy;
D O I
暂无
中图分类号
O484.1 [薄膜的生长、结构和外延];
学科分类号
摘要
A high-quality GaOthin film is deposited on an SiC substrate to form a heterojunction structure.The band alignment of the GaO/6H-SiC heterojunction is studied by using synchrotron radiation photoelectron spectroscopy. The energy band diagram of the GaO/6H-SiC heterojunction is obtained by analysing the binding energies of Ga 3d and Si 2p at the surface and the interface of the heterojunction.The valence band offset is experimentally determined to be 2.8 eV and the conduction band offset is calculated to be 0.89 eV,which indicate a type-Ⅱband alignment.This provides useful guidance for the application of GaO/6H-SiC electronic devices.
引用
收藏
页码:382 / 385
页数:4
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