MAXIMUM ENTROPY DECONVOLUTION OF XPS PEAK

被引：0

作者：

王典芬

汪海

机构：

来源：

Journal of Wuhan University of Technology-Materials Science | 1994年 / 04期

关键词：

X-ray photoelectron spectrum (XPS) peak; maximum entropy decovolution method (MEM) software;

D O I：

暂无

中图分类号：

O657.3 [光化学分析法（光谱分析法）];

学科分类号：

摘要：

Necessity of XPS spectrum,deconvolution,disadvantages of the traditional Fast Fourier Tranderm decon-volution method(FFT),princtple,method and advantage ofMaximum Entropy Deconvolution Method (MEM) are de-scribed.Criteria for determing the number of data points sam-pled in MEM are the main point disccussed in the paper,someXPS deconvolution applications of our MEM software showthat the MEM makes XPS deconvolution much easier than thetraditional FFT method.

引用

页码：19 / 25

页数：7

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