High-resolution electron microscopy for heterogeneous catalysis research

被引:0
|
作者
朱勇 [1 ]
许名权 [1 ]
周武 [1 ]
机构
[1] School of Physical Sciences and CAS Center for Excellence in Topological Quantum Computation,University of Chinese Academy of Sciences
关键词
atomic resolution; electron microscopy; three-dimensional(3D) reconstruction; in-situ; heterogeneous catalysts;
D O I
暂无
中图分类号
TN16 [电子光学仪器]; TQ426 [催化剂(触媒)];
学科分类号
0803 ; 080401 ; 080502 ; 081705 ;
摘要
Heterogeneous catalysts are the most important catalysts in industrial reactions. Nanocatalysts, with size ranging from hundreds of nanometers to the atomic scale, possess activities that are closely connected to their structural characteristics such as particle size, surface morphology, and three-dimensional topography. Recently, the development of advanced analytical transmission electron microscopy(TEM) techniques, especially quantitative high-angle annular darkfield(HAADF) imaging and high-energy resolution spectroscopy analysis in scanning transmission electron microscopy(STEM) at the atomic scale, strengthens the power of(S)TEM in analyzing the structural/chemical information of heterogeneous catalysts. Three-dimensional reconstruction from two-dimensional projected images and the real-time recording of structural evolution during catalytic reactions using in-situ(S)TEM methods further broaden the scope of(S)TEM observation. The atomic-scale structural information obtained from high-resolution(S)TEM has proven to be of significance for better understanding and designing of new catalysts with enhanced performance.
引用
收藏
页码:37 / 52
页数:16
相关论文
共 50 条
  • [21] THE USE OF HIGH-RESOLUTION ELECTRON-MICROSCOPY IN FUNDAMENTAL ZEOLITE RESEARCH
    ZANDBERGEN, HW
    VANDYCK, D
    ZEOLITES : FACTS, FIGURES, FUTURE, PTS A & B, 1989, 49 : 599 - 608
  • [22] Electron microscopy: Cutting the cost of high-resolution microscopy
    Koster, AJ
    Zandbergen, H
    NATURE MATERIALS, 2005, 4 (12) : 885 - 886
  • [23] ENHANCEMENT OF HIGH-RESOLUTION ELECTRON MICROSCOPY BY ELECTRON DIFFRACTION
    Li, F. H.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C221 - C221
  • [24] High-resolution electron microscopy and electron tomography: resolution versus precision
    Van Aert, S
    den Dekker, AJ
    Van Dyck, D
    van den Bos, A
    JOURNAL OF STRUCTURAL BIOLOGY, 2002, 138 (1-2) : 21 - 33
  • [25] THE FUTURE OF HIGH-RESOLUTION ELECTRON-MICROSCOPY
    COWLEY, JM
    ULTRAMICROSCOPY, 1985, 18 (1-4) : 463 - 468
  • [26] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF A ZEOLITE
    NILSSON, AE
    THOMASSON, R
    ULTRAMICROSCOPY, 1988, 24 (01) : 73 - 73
  • [27] HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPY
    CARPENTER, RW
    ULTRAMICROSCOPY, 1982, 8 (1-2) : 79 - 93
  • [28] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DUMORTIERITE
    VANDYCK, D
    TAMBUYSER, P
    VANLANDUYT, J
    AMELINCKX, S
    AMERICAN MINERALOGIST, 1976, 61 (9-10) : 1016 - 1019
  • [29] Study of polyanilines by high-resolution electron microscopy
    Mazerolles, L
    Folch, S
    Colomban, P
    MACROMOLECULES, 1999, 32 (25) : 8504 - 8508
  • [30] High-resolution electron microscopy of Technegas and Pertechnegas
    Lloyd, JJ
    Lawson, RS
    Shields, RA
    NUCLEAR MEDICINE COMMUNICATIONS, 1996, 17 (09) : 822 - 823