FEM thermal analysis of high power GaN-on-diamond HEMTs
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作者:
Xudong Chen
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机构:
Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong UniversityKey Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Xudong Chen
[1
,2
]
Wenbo Zhai
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机构:
Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong UniversityKey Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Wenbo Zhai
[1
,2
]
Jingwen Zhang
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机构:
Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong University
ISCAS-XJTU Joint Laboratory of Functional Materials and Devices for Informatics,School of Electronics and Information Engineering,Xi'an Jiaotong UniversityKey Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Jingwen Zhang
[1
,2
,3
]
Renan Bu
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Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong UniversityKey Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Renan Bu
[2
]
Hongxing Wang
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Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong UniversityKey Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Hongxing Wang
[2
]
Xun Hou
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Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong UniversityKey Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
Xun Hou
[2
]
机构:
[1] Key Laboratory for Physical Electronics and Devices of the Ministry of Education and Key Laboratory of Photonics Technology for Information of Shaanxi Province,School of Electronics and Information Engineering,Xi'an Jiaotong University
[2] Wide Band Gap Semiconductor Research Center,Xi'an Jiaotong University
[3] ISCAS-XJTU Joint Laboratory of Functional Materials and Devices for Informatics,School of Electronics and Information Engineering,Xi'an Jiaotong University
FEM;
GaN-on-diamond HEMTs;
self-heating;
temperature distribution;
D O I:
暂无
中图分类号:
TN386 [场效应器件];
学科分类号:
0805 ;
080501 ;
080502 ;
080903 ;
摘要:
A three-dimensional thermal analysis of GaN HEMTs on diamond substrate is investigated using the finite element method. The diamond substrate thickness, area and shape, transition layer thickness and thermal conductivity of the transition layer are considered and treated appropriately in the numerical simulation. The temperature distribution and heat spreading paths are investigated under different conditions and the results indicate that the existence of the transition layer causes an increase in the channel temperature and the thickness, area and shape of the diamond substrate have certain impacts on the channel temperature too. Channel temperature reduces with increasing diamond substrate thickness and area but with a decreasing trend, which can be explained by the saturation effects of the diamond substrate. The shape of diamond substrate also affects the temperature performance of GaN HEMTs, therefore, to achieve a favorable heat dissipation effect with the settled diamond substrate area, the shape should contain as many isothermal curves as possible when the isothermal gradient is constant. The study of the thermal properties of GaN on diamond substrate is useful for the prediction of heating of high power GaN HEMTs devices and optimal designs of an efficient heat spreader for GaN HEMTs.
机构:
Akash Syst, San Francisco, CA 94108 USAUniv Bristol, Sch Phys, Bristol BS8 1TL, Avon, England
Francis, Daniel
Ritchie, Robert O.
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Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Mat Sci Div, Berkeley, CA 94720 USAUniv Bristol, Sch Phys, Bristol BS8 1TL, Avon, England
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Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USAMeisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan
Cheng, Zhe
Mu, Fengwen
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Meisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan
Waseda Univ, Kagami Mem Res Inst Mat Sci & Technol, Shinjuku Ku, Tokyo 1690051, JapanMeisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan
Mu, Fengwen
Yates, Luke
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Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USAMeisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan
Yates, Luke
Suga, Tadatomo
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Meisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, JapanMeisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan
Suga, Tadatomo
Graham, Samuel
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Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USAMeisei Univ, Collaborat Res Ctr, Hino, Tokyo 1918506, Japan
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Poust, Benjamin
Gambin, Vincent
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Gambin, Vincent
Sandhu, Rajinder
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Sandhu, Rajinder
Smorchkova, Ioulia
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Smorchkova, Ioulia
Lewis, Gregory
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Lewis, Gregory
Elmadjian, Raffi
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Elmadjian, Raffi
Li, Danny
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Li, Danny
Geiger, Craig
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Geiger, Craig
Heying, Benjamin
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Heying, Benjamin
Wojtowicz, Mike
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Wojtowicz, Mike
Oki, Aaron
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Northrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Oki, Aaron
Pate, Bradford B.
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Naval Res Lab, Washington, DC 20375 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Pate, Bradford B.
Feygelson, Tatyana
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Naval Res Lab, Washington, DC 20375 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Feygelson, Tatyana
Hobart, Karl
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Naval Res Lab, Washington, DC 20375 USANorthrop Grumman Aerosp Syst, Redondo Beach, CA 90278 USA
Hobart, Karl
2013 IEEE COMPOUND SEMICONDUCTOR INTEGRATED CIRCUIT SYMPOSIUM (CSICS): INTEGRATED CIRCUITS IN GAAS, INP, SIGE, GAN AND OTHER COMPOUND SEMICONDUCTORS,
2013,
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Univ Sci & Technol Beijing, Inst Adv Mat & Technol, Beijing 100083, Peoples R ChinaUniv Sci & Technol Beijing, Inst Adv Mat & Technol, Beijing 100083, Peoples R China
Jia, Xin
Wei, Jun-jun
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Univ Sci & Technol Beijing, Inst Adv Mat & Technol, Beijing 100083, Peoples R ChinaUniv Sci & Technol Beijing, Inst Adv Mat & Technol, Beijing 100083, Peoples R China
Wei, Jun-jun
Kong, Yuechan
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Nanjing Elect Devices Inst, Sci & Technol Monolith Integrated Circuits & Modu, Nanjing, Jiangsu, Peoples R ChinaUniv Sci & Technol Beijing, Inst Adv Mat & Technol, Beijing 100083, Peoples R China
Kong, Yuechan
Li, Cheng-ming
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Li, Cheng-ming
Liu, Jinlong
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Chen, Liangxian
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Sun, Fangyuan
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