共 50 条
- [41] A Generalisable Component-Level ESD Failure Characterisation for TLP Measurements PROCEEDINGS OF THE 2021 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC 2021), 2021,
- [45] Component-Level Shielding with Assembled Copper Trenches in Package Slots SOUTHEASTCON 2023, 2023, : 38 - 42
- [46] Development of component-level damage evolution models for mechanical prognosis JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 2008, 75 (02): : 0210171 - 02101715
- [47] Characterising Soft-Failures in Component-Level ESD Testing 2018 14TH CONFERENCE ON PHD RESEARCH IN MICROELECTRONICS AND ELECTRONICS (PRIME 2018), 2018, : 93 - 96
- [49] Packaging Trends in Mobile Electronics - Towards Wafer Level Packaging PROCEEDINGS OF THE 2010 34TH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY CONFERENCE (IEMT 2010), 2011,