A method for predicting thermal expansion coefficients of carbon fiber/epoxy composites with void defects

被引:0
|
作者
Wang, Dong [1 ,2 ]
Huang, Hao [1 ]
Shan, Zhongde [3 ]
Liu, Feng [2 ]
Liu, Jianhua [1 ]
Guo, Zitong [3 ]
机构
[1] Beijing Inst Technol, Sch Mech Engn, Beijing 10081, Peoples R China
[2] China Acad Machinery Sci & Technol, State Key Lab Adv Forming Technol & Equipment, Beijing, Peoples R China
[3] Nanjing Univ Aeronaut & Astronaut, Coll Mech & Elect Engn, Nanjing 210016, Peoples R China
关键词
analytical model; carbon fiber/epoxy composites; finite element model; thermal expansion; void defects; UNIDIRECTIONAL COMPOSITES; EPOXY-RESIN; BEHAVIORS; TEMPERATURE; TRANSVERSE; FIBERS; MODEL;
D O I
10.1002/pc.29245
中图分类号
TB33 [复合材料];
学科分类号
摘要
To predict the coefficient of thermal expansion (CTE) of carbon fiber/epoxy resin composites with void defects comprehensively and accurately, a comprehensive study is carried out by integrating experiment, analytical model (ANM), and finite element model (FEM). The experiments on composites are conducted combining with Micro-CT to provide geometric parameters and verification for ANM and FEM. An ANM considering void defects is established based on the Chamis model to investigate the influence of porosity, temperature and the ratio of modulus of the constituents of composites. A FEM is established to verify the ANM and reveal the mechanisms of the influence of void defects. The results show that the proposed ANM has high agreement with FEM and experiment. The longitudinal CTE decreases by 61.94% as the porosity increases from 0% to 20% at 60 degrees C, and the same change of porosity results in a 15.62% decrease at 180 degrees C. The transverse CTE is less susceptible to changes in porosity, showing reductions of 2.32% at 60 degrees C and 3.33% at 180 degrees C.Highlights An innovative model is proposed to predict CTE considering void defects. The glass transition temperature Tg of the resin has a significant effect on CTE. Void defects change the homogeneity of the original stress field of the matrix. The reduction of the longitudinal CTE caused by void defects is more significant.
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页数:17
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