Event-Triggered Fault Detection - An Integrated Design Approach Directly Toward Fault Diagnosis Performance

被引:0
|
作者
Qiu, Aibing [1 ]
Hu, Yu [1 ]
Wu, Jingsong [2 ]
机构
[1] Nantong Univ, Sch Elect Engn, Nantong 226019, Peoples R China
[2] Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai Key Lab Power Stn Automat Technol, Shanghai 200444, Peoples R China
基金
中国国家自然科学基金;
关键词
Fault diagnosis; Fault detection; Integrated design; Remote monitoring; Generators; Uncertainty; Sufficient conditions;
D O I
10.1109/JAS.2023.124074
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Dear Editor, This letter investigates an integrated design approach directly toward fault diagnosis performance for event-triggered systems. By evaluating the effects of all external inputs on residual under the event-triggered mechanism, the event-triggered false alarm rate (FAR) and fault detection rate (FDR) are defined and their relationship is established. Based on this, the residual generation and evaluation are designed in an integrated manner to maximize temp FDR for a given FAR with the help of linear matrix inequality (LMI) and an iterative algorithm. A benchmark model of vehicle lateral dynamics system is employed to demonstrate the superiority of the proposed approach over the existing widely used separated design approaches.
引用
收藏
页码:2528 / 2530
页数:3
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