Impact of Mo Barrier Layers on the Interface and Microstructure of Al/Sc Multilayers for the Extreme Ultraviolet Range

被引:0
|
作者
Wang, Zile [1 ,2 ]
Lai, Bo [1 ,2 ]
Zhang, Zhe [1 ,2 ]
Chang, Chenyuan [1 ,2 ]
Wu, Yanqing [4 ,5 ]
Jiang, Li [1 ,2 ]
Qi, Runze [1 ,2 ,3 ]
Huang, Qiushi [1 ,2 ,3 ]
Zhang, Zhong [1 ,2 ]
Wang, Zhanshan [1 ,2 ]
机构
[1] Tongji Univ, Inst Precis Opt Engn IPOE, Sch Phys Sci & Engn, MOE,Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China
[2] Tongji Univ, Full Spectrum High Performance Opt Thin Film Devic, Shanghai 200092, Peoples R China
[3] Zhejiang Tongyue Opt Technol Co Ltd, Huzhou 313199, Peoples R China
[4] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China
[5] Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China
基金
中国国家自然科学基金;
关键词
extreme ultraviolet; Al/Scmultilayer; Mo barrierlayer; interface; crystallization; X-RAY-ABSORPTION; SPECTROSCOPY; SCATTERING; REFLECTIVITY; COATINGS; MIRRORS; SC;
D O I
10.1021/acsami.4c22676
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Al/Sc multilayers are potential optical elements to be used for the extreme ultraviolet range at wavelengths longer than the Sc M2,3 absorption edge. The existing research exhibits a significant gap concerning the incorporation of a barrier layer within the Al/Sc multilayer to enhance interface quality. A series of Al/Sc, Al/Sc/Mo, Al/Mo/Sc, and Al/Mo/Sc/Mo multilayers were fabricated by the direct-current magnetron sputtering technique. Grazing incidence X-ray reflectivity, transmission electron microscopy, selected area electron diffraction, energy-dispersive X-ray spectroscopy, X-ray diffraction, and X-ray absorption spectroscopy were used to investigate the effect of Mo barrier layers on interface properties and layer microstructure of Al/Sc multilayers. The results indicate that Mo barrier layers with a thickness of approximately 0.5 nm at different interfaces perform different functions. The Mo barriers at Al-on-Sc interfaces primarily play a role in suppressing the columnar crystallization of Al layers, contributing to the smoothening of interfacial roughness. The thin Mo layers at Sc-on-Al interfaces mainly act as antidiffusion barriers, preventing the diffusion of Al atoms into Sc layers. A model of the impact of Mo barrier layers on the interface diffusion and microstructure of Al/Sc multilayers has been established.
引用
收藏
页码:21975 / 21984
页数:10
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