In-situ Stress Analysis of Nickel Nanoparticle Sintering with Metal Additive in Multi-Layer Ceramic Capacitors

被引:0
|
作者
Jung, Youngran [1 ]
Joo, Wonhyo [2 ]
Lee, Kyung Rul [2 ]
Kim, Cheol [1 ]
Choi, Min-Jung [1 ]
Joo, Young-Chang [1 ,3 ]
Lee, So-Yeon [4 ]
机构
[1] Seoul Natl Univ, Dept Mat Sci & Engn, 1 Gwanak Ro, Seoul 08826, South Korea
[2] Samsung Electromech, Corp R&D Inst, Suwon 16674, Gyeonggi, South Korea
[3] Seoul Natl Univ, Res Inst Adv Mat RIAM, Seoul 08826, South Korea
[4] Kumoh Natl Inst Technol, Sch Mat Sci & Engn, 61 Daehak Ro Gumi, Gumi 39177, Gyeongbuk, South Korea
关键词
Sintering; Nickel; Intermetallic compounds; Characterization; In-situ stress analysis; DIELECTRIC-PROPERTIES; GRAIN-GROWTH; POWDERS; DENSIFICATION;
D O I
10.1007/s13391-025-00556-w
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In the pursuit of increasing the sintering temperature of multi-layer ceramic capacitors (MLCCs) of the metal electrode layer, this study examines the effect of secondary metal additives on the sintering behavior of nickel (Ni) nanoparticles. Traditionally, the discrepancy in sintering temperatures between metal and dielectric particles poses a challenge in MLCC fabrication, often resulting in uneven layer formation and device shortage. We introduced 0.1 atomic percent of tin (Sn), antimony (Sb), and cobalt (Co) into Ni nanoparticles and investigated their influence on sintering temperatures in the metal layer. Utilizing in-situ stress analysis and field emission scanning electron microscope (FE-SEM) imaging, we found that Sn and Sb effectively hindered the onset of neck formation and coalescence by forming intermetallic phases, whereas Co showed no such effect. These findings suggest that the strategic addition of specific secondary metals can shift the sintering behavior initiation of Ni related to the structural integrity during the MLCC fabrication and the performance of MLCCs. The research highlights the potential of using secondary metal additives to refine the thermal processing steps in electronic component manufacturing, aiming for more reliable and efficient devices.
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页数:9
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