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- [5] Electrothermal Characteristics of Carbon-Based Through-Silicon Via (TSV) Channel 2015 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS SYMPOSIUM, 2015, : 9 - 11
- [6] High frequency simulation of through-silicon via(TSV) failure 2018 20TH INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING (EMAP), 2018,
- [7] Coupling Capacitance Extraction in Through-Silicon Via (TSV) Arrays 2015 IEEE CONFERENCE ON ELECTRONICS, CIRCUITS, AND SYSTEMS (ICECS), 2015, : 470 - 473
- [8] Accurate Power and Latency Analysis of a Through-Silicon Via(TSV) 2018 INTERNATIONAL CONFERENCE ON ADVANCES IN COMPUTING, COMMUNICATIONS AND INFORMATICS (ICACCI), 2018, : 688 - 694
- [10] A Systematic Test Approach for Through-Silicon Via (TSV) Process 2015 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS (IMWS-AMP), 2015, : 56 - 58