Ultrafast EUV microscopy of self-assembled nanomaterials

被引：0
|
作者：
Grova, Carmelo [1 ]
Karpov, Dmitry [2 ]
Giani, Nicola [1 ]
Bevis, Charles S. [1 ]
Adams, Daniel E. [3 ]
Mancini, Giulia [1 ]
机构：
[1] Univ Pavia, Dept Phys, Lab Ultrafast Xray & Electron Microscopy LUXEM, I-27100 Pavia, Italy
[2] European Synchrotron Radiat Facil, 71 Ave Martyrs, F-38000 Grenoble, France
[3] Colorado Sch Mines, Dept Phys, 1523 Illinois St, Golden, CO 80401 USA
来源：
PHYSICAL CHEMISTRY OF SEMICONDUCTOR MATERIALS AND INTERFACES XXIII | 2024年 / 13127卷
基金：
欧盟地平线“2020”;
关键词：
High-Harmonic Generation; EUV; microscopy; nanoparticles;
D O I：
10.1117/12.3027994
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We report the design of an Extreme Ultraviolet microscope relying on Ultrafast Ptychographic Coherent Diffractive Imaging. This compact tool is capable of imaging the functional response of interfaces and heterogeneous nanomaterials activated by light pulses, across length scales, with high spatio-temporal resolutions, and with exquisite contrast to their chemical composition and to their morphology.
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页数：3
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