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- [42] Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (03):
- [43] Observation of artifact-free amorphous structure in Cu-Zr-based alloy using transmission electron microscopy MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2005, 406 (1-2): : 119 - 124
- [47] Analysis of Absorption and Phase Difference Images from Differential Interference Contrast Microscopy 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2011, 1365 : 246 - 249