Structured illumination microscopy based on Kramers-Kronig relations for quantitative phase reconstruction

Structured illumination microscopy (SIM) is a widely applied fluorescence super-resolution imaging technique. It can also serve as high-throughput imaging in coherent imaging systems. However, coherent SIM requires additional qualitative/quantitative phase imaging methods to acquire phase information. This paper proposes a structured illumination microscopy technique based on the Kramers-Kronig relations (KK-SIM) that achieves quantitative phase imaging without the need for extra technical assistance and relies solely on the spatial-domain intensity images reconstructed through conventional SIM. KK-SIM utilizes a non-iterative approach to recover intensity into amplitude and phase, maintaining SIM's high acquisition speed and reconstruction efficiency. Our work enables highthroughput quantitative phase imaging using conventional SIM experimental setups and data post-processing, making SIM suitable for label-free, noninvasive dynamic observalar technologies, are reserved.