Advanced Analytical Technologies for a Terawatt Laser Facility

被引：0
|
作者：
Hemani, Yousuf [1 ,2 ]
Galimberti, Marco [3 ]
Koch, Kilian [2 ]
Bleiner, Davide [1 ,2 ]
机构：
[1] Univ Zurich, Dept Chem, Zurich, Switzerland
[2] Swiss Fed Inst Mat Sci & Technol Empa, Dubendorf, Switzerland
[3] Rutherford Appleton Lab, CLF, UKRI, STFC, Didcot, Oxon, England
来源：
X-RAY LASERS 2023 | 2024年 / 403卷
关键词：
High energy; Laser facility; Tabletop X-rays; Ultrafast laser; Spectroscopy; CHIRPED-PULSE AMPLIFICATION; EXPANSION-COMPRESSION; GENERATION; STRETCHER; COMPENSATION; DISPERSION; DESIGN; SYSTEM;
D O I：
10.1007/978-3-031-65913-3_2
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
High energy, high power, ultrashort lasers enable a plethora of applications in the field of material sciences and analytical chemistry. From generation of protons to X-rays on a tabletop, Terawatt (TW) Class lasers can be used for round the clock, chemical imaging and spectro-chemistry in the laboratory environment. These lasers are enabled by the technique of Chirped Pulse Amplification (CPA). The design, development and characterization of such a laser facility is presented. The development of this laser facility is fully supported by novel, optical and digital diagnostics for characterization of the drive pulse for dispersion, pulse duration and energy. For real-time monitoring of the laser facility and enabling user-friendly operation, a smart data platform using openBIS Electronics Lab Notebook (ELN) is developed to enable regular and uninterrupted saving of raw data which is integrated into the local dashboard for visualization and data analysis.
引用
收藏
页码：17 / 40
页数：24
相关论文
共 50 条
  • [31] Transport mirror laser damage mitigation technologies on the National Ignition Facility
    Stolz, Christopher J.
    Qiu, S. Roger
    Negres, Raluca A.
    Bass, Isaac L.
    Miller, Phil E.
    Cross, David A.
    Davis, James A.
    Sommer, Stanley
    Widmayer, Clay C.
    MacGowan, Brian J.
    Whitman, Pamela K.
    Wegner, Paul J.
    ADVANCES IN OPTICAL THIN FILMS VI, 2018, 10691
  • [32] ENGINEERING CONSIDERATIONS OF THE ADVANCED FREE-ELECTRON LASER FACILITY
    MEIER, KL
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 318 (1-3): : 153 - 158
  • [33] Experimental prospects at the Canadian advanced laser light source facility
    Ozaki, T
    Kieffer, JC
    Toth, R
    Fourmaux, S
    Bandulet, H
    LASER AND PARTICLE BEAMS, 2006, 24 (01) : 101 - 106
  • [34] Terawatt femtosecond Cr : forstente laser system
    Agranat, MB
    Ashitkov, SI
    Ivanov, AA
    Konyashchenko, AV
    Ovchinnikov, AV
    Fortov, VE
    QUANTUM ELECTRONICS, 2004, 34 (06) : 506 - 508
  • [35] Propagation of femtosecond terawatt laser in atmosphere and applications
    Mejean, G.
    ANNALES DE PHYSIQUE, 2005, 30 (06) : 1 - +
  • [36] SRS PULSE FOR FEMTOSECOND TERAWATT LASER SYSTEMS
    LOSEV, LL
    LUTSENKO, AP
    KVANTOVAYA ELEKTRONIKA, 1993, 20 (04): : 387 - 389
  • [37] Terawatt femtosecond Ti:sapphire laser system
    Babin, AA
    Kiselev, AM
    Sergeev, AM
    Stepanov, AN
    QUANTUM ELECTRONICS, 2001, 31 (07) : 623 - 626
  • [38] 0.27 Terawatt laser system at 1 kHz
    Backus, S
    Durfee, CG
    Kapteyn, HC
    Murnane, MM
    APPLICATIONS OF HIGH-FIELD AND SHORT WAVELENGTH SOURCES, 1998, : 17 - 21
  • [39] A facility for the research, development, and translation of advanced technologies for ion-beam therapies
    Lis, M.
    Newhauser, W.
    Donetti, M.
    Durante, M.
    Weber, U.
    Zipfel, B.
    Hartmann-Sauter, C.
    Wolf, M.
    Graeff, C.
    JOURNAL OF INSTRUMENTATION, 2021, 16 (03)
  • [40] Advanced x-ray and extreme ultraviolet diagnostics and first applications to x-pinch plasma experiments at the Nevada Terawatt Facility
    Kantsyrev, V
    Bauer, B
    Shlyaptseva, A
    Fedin, D
    Hansen, S
    Presura, R
    Batie, S
    Brinsmead, W
    Faretto, H
    Le Galloudec, B
    Oxner, A
    Chamberlain, D
    Ouart, N
    Jones, A
    LeBeau, H
    Gharaibeh, M
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (01): : 663 - 666
12345