The Bi-O edge sensor: from theory to practice

Resolution and sensitivity of the wavefront sensor (WFS) are key requirements for eXtreme Adaptive Optics (XAO) applications. We present a new class of WFSs, the Bi-Orthogonal Foucault-knife-edge (Bi-O edge), that is directly inspired by the Foucault knife-edge test. The idea consists of using a beam-splitter producing two foci, each of which is sensed by an edge with an orthogonal direction to the other. We describe two implementation concepts. The first one, the tip-tilt modulated sharp Bi-O-edge, can be seen as a mild evolution of the Pyramid. The second one uses a smooth, gradual amplitude mask over a 'grey' zone on the edge (grey Bi-O edge). We analyze the increased gain in sensitivity and the super-resolution capability, we compare these properties to the Pyramid sensor and produce end-to-end simulations. An important advantage of the grey Bi-O edge is the static modulation which is well adapted for fast XAO systems. The grey edge consists of a rectangular zone on the edge of the same size as the modulation circle. We will discuss the manufacturability of loss-less grey Foucault-knife edges, and we develop a polarization-based technique for the Bi-O edge prototype for the ESO GHOST test bench.