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- [22] Simulation of effect of current stressing on reliability of solder joints with Cu-pillar bumps World Academy of Science, Engineering and Technology, 2010, 61 : 307 - 311
- [23] Simulation of effect of current stressing on reliability of solder joints with cu-pillar bumps World Academy of Science, Engineering and Technology, 2010, 37 : 307 - 311
- [24] Joule heating effect on oxide whisker growth induced by current stressing in Cu/Sn-58Bi/Cu solder joint Electronic Materials Letters, 2012, 8 : 463 - 466
- [26] Research on Temperature Gradient Effect to Solder Joint Reliability 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING (EMAP 2012), 2012,
- [28] Failure behaviors of Sn-0.3Ag-0.7Cu solder joint under creep and current stressing 2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2014, : 902 - 906