X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation

被引：0
|
作者：
D. Zverev [1 ]
M. Sorokovikov [1 ]
V. Yunkin [2 ]
S. Kuznetsov [2 ]
A. Snigirev [1 ]
机构：
[1] Immanuel Kant Baltic Federal University,
[2] Institute of Microelectronics Technology RAS,undefined
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2024年 / 18卷 / Suppl 1期
关键词：
X-ray optics; compound refractive lenses; coherence; interferometer; synchrotron; source diagnostics;
D O I：
10.1134/S1027451024701854
中图分类号：
学科分类号：
摘要：
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页码：S45 / S50
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