X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation

被引:0
|
作者
D. Zverev [1 ]
M. Sorokovikov [1 ]
V. Yunkin [2 ]
S. Kuznetsov [2 ]
A. Snigirev [1 ]
机构
[1] Immanuel Kant Baltic Federal University,
[2] Institute of Microelectronics Technology RAS,undefined
关键词
X-ray optics; compound refractive lenses; coherence; interferometer; synchrotron; source diagnostics;
D O I
10.1134/S1027451024701854
中图分类号
学科分类号
摘要
引用
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页码:S45 / S50
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