Characterization of Ba-Sr - Sr thin films deposited by spray pyrolysis and fabrication of Ag/Ba-Sr/n-Si/Ag - Sr/n-Si/Ag diodes
被引:1
|
作者:
Sakthivel, M.
论文数: 0引用数: 0
h-index: 0
机构:
St Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Sakthivel, M.
[1
]
Mary, S. Stella
论文数: 0引用数: 0
h-index: 0
机构:
St Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Mary, S. Stella
[1
]
Akila, T.
论文数: 0引用数: 0
h-index: 0
机构:
Saveetha Univ, Saveetha Inst Med & Tech Sci, Saveetha Sch Engn, Dept Phys, Chennai 602105, Tamil Nadu, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Akila, T.
[2
]
Alodhayb, Abdullah N.
论文数: 0引用数: 0
h-index: 0
机构:
King Saud Univ, King Abdullah Inst Nanotechnol, POB 2455, Riyadh 11451, Saudi ArabiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Alodhayb, Abdullah N.
[3
]
Muthuramamoorthy, Muthumareeswaran
论文数: 0引用数: 0
h-index: 0
机构:
King Saud Univ, King Abdullah Inst Nanotechnol, POB 2455, Riyadh 11451, Saudi ArabiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Muthuramamoorthy, Muthumareeswaran
[3
]
Balasubramani, V.
论文数: 0引用数: 0
h-index: 0
机构:
Saveetha Univ, Saveetha Inst Med & Tech Sci, Saveetha Sch Engn, Dept Phys, Chennai 602105, Tamil Nadu, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Balasubramani, V.
[2
]
机构:
[1] St Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
[2] Saveetha Univ, Saveetha Inst Med & Tech Sci, Saveetha Sch Engn, Dept Phys, Chennai 602105, Tamil Nadu, India
[3] King Saud Univ, King Abdullah Inst Nanotechnol, POB 2455, Riyadh 11451, Saudi Arabia
This study describes the synthesis of barium (Ba) and strontium (Sr) thin films using jet neublizer spray pyrolysis (JNSP) technology, which facilitates the fabrication of junction diodes whose structure, surface morphology, and optical properties are affected by significant water absorption. Ba-Sr films with different strontium concentrations (specifically 0, 2, 4 and 6 wt%) were further investigated to provide a better understanding of how this change affects the final diode type. The research design focuses on fabricating n-type silicon junction diodes containing barium and strontium and directly measuring and analyzing their I-V characteristics, ultimately helping elucidate these devices' electrical behavior. Among the analyzed diodes, the Ag/Ba-Sr/n-Si/Ag diode performed well in various design tests, indicating its competitiveness due to its goodness in optoelectronic devices. The ideal value (n) of a 6 wt% Ba-Sr diode is 1.77 and the barrier height (Phi(B)) is 0.84 eV. These results demonstrate the general future of Ba-Sr junction diode, as they not only reveal important discoveries regarding their electrical properties but also demonstrate the potential for improved performance in optoelectronic applications.
机构:
St Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Sakthivel, M.
Mary, S. Stella
论文数: 0引用数: 0
h-index: 0
机构:
St Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Mary, S. Stella
Balasubramani, V.
论文数: 0引用数: 0
h-index: 0
机构:
Saveetha Inst Med & Tech Sci, Saveetha Sch Engn, Dept Phys, Chennai 602105, Tamil Nadu, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Balasubramani, V.
Shkir, Mohd
论文数: 0引用数: 0
h-index: 0
机构:
King Khalid Univ, Res Ctr Adv Mat Sci RCAMS, POB 9004, Abha 61413, Saudi Arabia
King Khalid Univ, Fac Sci, Dept Phys, POB 9004, Abha, Saudi Arabia
Lovely Profess Univ, Div Res & Dev, Phagwara 144411, Punjab, IndiaSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
Shkir, Mohd
Ali, H. Elhosiny
论文数: 0引用数: 0
h-index: 0
机构:
King Khalid Univ, Fac Sci, Dept Phys, POB 9004, Abha, Saudi Arabia
Zagazig Univ, Fac Sci, Phys Dept, Zagazig 44519, EgyptSt Peters Inst Higher Educ & Res, Dept Phys, Chennai 600066, Tamil Nadu, India
机构:
Natl Res Ctr, Solid State Phys Dept, Phys Div, Solid State Elect Lab, Giza 12622, EgyptNatl Res Ctr, Solid State Phys Dept, Phys Div, Solid State Elect Lab, Giza 12622, Egypt
Ashery, A.
Elnasharty, Mohamed M. M.
论文数: 0引用数: 0
h-index: 0
机构:
Natl Res Ctr, Microwave Phys & Dielect Dept, Giza 12622, EgyptNatl Res Ctr, Solid State Phys Dept, Phys Div, Solid State Elect Lab, Giza 12622, Egypt
Elnasharty, Mohamed M. M.
El Radaf, I. M.
论文数: 0引用数: 0
h-index: 0
机构:
Natl Res Ctr, Electron Microscope & Thin Films Dept, Phys Div, Giza 12622, Egypt
Qassim Univ, Mat Phys & Energy Lab, Coll Sci & Art ArRass, Arrass 51921, Saudi ArabiaNatl Res Ctr, Solid State Phys Dept, Phys Div, Solid State Elect Lab, Giza 12622, Egypt
机构:
Solid State Electronics Laboratory, Solid State Physics Department, Physics Division, National Research Centre, Dokki, Giza,12622, EgyptSolid State Electronics Laboratory, Solid State Physics Department, Physics Division, National Research Centre, Dokki, Giza,12622, Egypt
Ashery, A.
Elnasharty, Mohamed M.M.
论文数: 0引用数: 0
h-index: 0
机构:
Microwave Physics and Dielectrics Department, National Research Centre, Dokki, Giza,12622, EgyptSolid State Electronics Laboratory, Solid State Physics Department, Physics Division, National Research Centre, Dokki, Giza,12622, Egypt
Elnasharty, Mohamed M.M.
El Radaf, I.M.
论文数: 0引用数: 0
h-index: 0
机构:
Electron Microscope and Thin Films Department, Physics Division, National Research Centre, Dokki, Giza,12622, Egypt
Materials Physics and Energy Laboratory, College of Sciences and Art at ArRass - Qassim University, ArRass,51921, Saudi ArabiaSolid State Electronics Laboratory, Solid State Physics Department, Physics Division, National Research Centre, Dokki, Giza,12622, Egypt